Membership
Tour
Register
Log in
Gaurav Vohra
Follow
Person
Sudbury, MA, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Drive and sense stress relief apparatus
Patent number
11,692,825
Issue date
Jul 4, 2023
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Stress-relief MEMS gyroscope
Patent number
11,686,581
Issue date
Jun 27, 2023
Analog Devices, Inc.
Igor P. Prikhodko
G01 - MEASURING TESTING
Information
Patent Grant
Impedance measurement in diagnostic testing
Patent number
11,543,402
Issue date
Jan 3, 2023
Analog Devices, Inc.
Thomas G. O'Dwyer
G01 - MEASURING TESTING
Information
Patent Grant
Multiple anchor high frequency accelerometer
Patent number
11,415,595
Issue date
Aug 16, 2022
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Increased sensitivity z-axis accelerometer
Patent number
11,255,873
Issue date
Feb 22, 2022
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Vertical stopper for capping MEMS devices
Patent number
10,882,735
Issue date
Jan 5, 2021
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Z axis accelerometer using variable vertical gaps
Patent number
10,816,569
Issue date
Oct 27, 2020
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for driving a multi-oscillator system
Patent number
10,451,454
Issue date
Oct 22, 2019
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Vertical stopper for capping MEMS devices
Patent number
10,239,746
Issue date
Mar 26, 2019
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Method and apparatus for driving a multi-oscillator system
Patent number
10,168,194
Issue date
Jan 1, 2019
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for detecting linear and rotational movement
Patent number
9,709,595
Issue date
Jul 18, 2017
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Grant
Dual use of a ring structure as gyroscope and accelerometer
Patent number
9,599,471
Issue date
Mar 21, 2017
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
GYROSCOPES WITH ELECTRODES FOR TUNING CROSS-AXIS SENSITIVITY
Publication number
20250164246
Publication date
May 22, 2025
Analog Devices, Inc.
Tyler Dunn
G01 - MEASURING TESTING
Information
Patent Application
MEMS STRESS ISOLATION TECHNOLOGY WITH BACKSIDE ETCHED ISOLATION TRE...
Publication number
20240300808
Publication date
Sep 12, 2024
Analog Devices, Inc.
Kemiao Jia
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
SYNCHRONIZED MASS GYROSCOPE WITH FULL SYMMETRY AND TURNABILITY
Publication number
20240003684
Publication date
Jan 4, 2024
Analog Devices, Inc.
Igor P. Prikhodko
G01 - MEASURING TESTING
Information
Patent Application
DRIVE AND SENSE STRESS RELIEF APPARATUS
Publication number
20230288204
Publication date
Sep 14, 2023
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
DRIVE AND SENSE STRESS RELIEF APPARATUS
Publication number
20210381833
Publication date
Dec 9, 2021
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
STRESS-RELIEF MEMS GYROSCOPE
Publication number
20210381832
Publication date
Dec 9, 2021
Analog Devices, Inc.
Igor P. Prikhodko
G01 - MEASURING TESTING
Information
Patent Application
IMPEDANCE MEASUREMENT IN DIAGNOSTIC TESTING
Publication number
20210123902
Publication date
Apr 29, 2021
Analog Devices, Inc.
Thomas G. O'DWYER
G01 - MEASURING TESTING
Information
Patent Application
MULTIPLE ANCHOR HIGH FREQUENCY ACCELEROMETER
Publication number
20200408801
Publication date
Dec 31, 2020
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
INCREASED SENSITIVITY Z-AXIS ACCELEROMETER
Publication number
20200081029
Publication date
Mar 12, 2020
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Application
Z AXIS ACCELEROMETER USING VARIABLE VERTICAL GAPS
Publication number
20200081028
Publication date
Mar 12, 2020
Analog Devices, Inc.
Xin Zhang
G01 - MEASURING TESTING
Information
Patent Application
VERTICAL STOPPER FOR CAPPING MEMS DEVICES
Publication number
20190152766
Publication date
May 23, 2019
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
METHOD AND APPARATUS FOR DRIVING A MULTI-OSCILLATOR SYSTEM
Publication number
20190078912
Publication date
Mar 14, 2019
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
VERTICAL STOPPER FOR CAPPING MEMS DEVICES
Publication number
20180134543
Publication date
May 17, 2018
Analog Devices, Inc.
Jinbo Kuang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method and Apparatus for Driving a Multi-Oscillator System
Publication number
20170184644
Publication date
Jun 29, 2017
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
Dual Use of a Ring Structure as Gyroscope and Accelerometer
Publication number
20160153779
Publication date
Jun 2, 2016
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING
Information
Patent Application
Method and Apparatus for Detecting Linear and Rotational Movement
Publication number
20150128701
Publication date
May 14, 2015
Analog Devices, Inc.
Gaurav Vohra
G01 - MEASURING TESTING