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Gavin M. King
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Boulder, CO, US
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Patents Grants
last 30 patents
Information
Patent Grant
Nanotube processing employing solid-condensed-gas-layers
Patent number
8,273,257
Issue date
Sep 25, 2012
President and Fellows of Harvard College
Jene A. Golovchenko
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Lift-off patterning processes employing energetically-stimulated lo...
Patent number
8,221,595
Issue date
Jul 17, 2012
President and Fellows of Harvard College
Daniel Branton
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Patterning by energetically-stimulated local removal of solid-conde...
Patent number
7,993,538
Issue date
Aug 9, 2011
President and Fellows of Harvard College
Jene A. Golovchenko
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Real-time, active picometer-scale alignment, stabilization, and reg...
Patent number
7,928,409
Issue date
Apr 19, 2011
The United States of America as represented by the Secretary of Commerce
Thomas T. Perkins
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Controlled fabrication of gaps in electrically conducting structures
Patent number
7,582,490
Issue date
Sep 1, 2009
President and Fellows of Harvard College
Jene A. Golovchenko
G01 - MEASURING TESTING
Information
Patent Grant
Lift-off patterning processing employing energetically-stimulated l...
Patent number
7,524,431
Issue date
Apr 28, 2009
President and Fellows of Harvard College
Daniel Branton
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Patterning by energetically-stimulated local removal of solid-conde...
Patent number
7,435,353
Issue date
Oct 14, 2008
President and Fellows of Harvard College
Jene A. Golovchenko
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Solid state molecular probe device
Patent number
7,258,838
Issue date
Aug 21, 2007
President and Fellows of Harvard College
Jiali Li
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Real-time, active picometer-scale alignment, stabilization, and reg...
Publication number
20100257641
Publication date
Oct 7, 2010
The U.S.A., as represented by the Secretary of Commerce, The Ntl. Inst. of St...
Thomas T. Perkins
G01 - MEASURING TESTING
Information
Patent Application
Nanotube Processing Employing Solid-Condensed-Gas-Layers
Publication number
20090179005
Publication date
Jul 16, 2009
President and Fellows of Harvard College
Jene A. Golovchenko
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Lift-off patterning processes employing energetically-stimulated lo...
Publication number
20090173716
Publication date
Jul 9, 2009
President and Fellows of Harvard College
Daniel Branton
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Patterning by energetically-stimulated local removal of solid-conde...
Publication number
20090041949
Publication date
Feb 12, 2009
President and Fellows of Harvard College
Jene A. Golovchenko
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Patterning by energetically-stimulated local removal of solid-conde...
Publication number
20070262050
Publication date
Nov 15, 2007
Jene A. Golovchenko
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
ION BEAM SCULPTING OF MULTIPLE DISTINCT MATERIALS
Publication number
20070172386
Publication date
Jul 26, 2007
Jiali Li
G01 - MEASURING TESTING
Information
Patent Application
Lift-off patterning processes employing energetically-stimulated lo...
Publication number
20070128357
Publication date
Jun 7, 2007
Daniel Branton
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
Controlled fabrication of gaps in electrically conducting structures
Publication number
20040229386
Publication date
Nov 18, 2004
President and Fellows of Harvard College
Jene A. Golovchenko
G01 - MEASURING TESTING