Ge Cong

Person

Pleasanton, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Deep learning based defect detection
- Patent number 11,776,108
- Issue date Oct 3, 2023
- KLA Corp.
- Richard Wallingford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Setting up inspection of a specimen
- Patent number 11,748,872
- Issue date Sep 5, 2023
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image alignment for noisy images
- Patent number 11,494,924
- Issue date Nov 8, 2022
- KLA Corp.
- Vahid Noormofidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for determining type and size of defects on blank...
- Patent number 11,468,553
- Issue date Oct 11, 2022
- KLA Corporation
- Ramaprasad Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
BBP assisted defect detection flow for SEM images
- Patent number 11,450,012
- Issue date Sep 20, 2022
- KLA Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cassette attachment device for detecting intensity of test strip ca...
- Patent number 10,033,912
- Issue date Jul 24, 2018
- HUNAN EHOME HEALTH TECHNOLOGY COMPANY LIMITED
- Ge Cong
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method for fast test strip intensity recognition
- Patent number 9,240,039
- Issue date Jan 19, 2016
- Ge Cong
- G01 - MEASURING TESTING
Information Patent Grant
Detection of thin line for selective sensitivity during reticle ins...
- Patent number 8,090,189
- Issue date Jan 3, 2012
- KLA-Tencor Corporation
- Vinayak Dattatreya Phalke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROCESSING SENSOR DATA USING LANGUAGE MODELS IN MAP GENERATION SYST...
- Publication number 20240419903
- Publication date Dec 19, 2024
- NVIDIA Corporation
- Shuang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING LANGUAGE MODELS TO VERIFY MAP DATA IN MAP GENERATION SYSTEMS...
- Publication number 20240419904
- Publication date Dec 19, 2024
- NVIDIA Corporation
- Shuang Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
USING LARGE LANGUAGE MODELS FOR SIMILARITY DETERMINATIONS IN CONTEN...
- Publication number 20240419907
- Publication date Dec 19, 2024
- NVIDIA Corporation
- Denis Laprise
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIMODE DEFECT DETECTION
- Publication number 20240161272
- Publication date May 16, 2024
- KLA Corporation
- Sangbong Park
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR OPTICAL WAFER CHARACTERIZATION WITH IMAGE UP...
- Publication number 20220383470
- Publication date Dec 1, 2022
- Abdurrahman Sezginer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Setting Up Inspection of a Specimen
- Publication number 20220067898
- Publication date Mar 3, 2022
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEEP LEARNING BASED DEFECT DETECTION
- Publication number 20220044391
- Publication date Feb 10, 2022
- KLA Corporation
- Richard Wallingford
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE ALIGNMENT FOR NOISY IMAGES
- Publication number 20210334989
- Publication date Oct 28, 2021
- KLA Corporation
- Vahid Noormofidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BBP Assisted Defect Detection Flow for SEM Images
- Publication number 20210133989
- Publication date May 6, 2021
- KLA Corporation
- Santosh Bhattacharyya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Determining Type and Size of Defects on Blank...
- Publication number 20200143528
- Publication date May 7, 2020
- KLA Corporation
- Ramaprasad Kulkarni
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CASSETTE ATTACHMENT DEVICE FOR DETECTING INTENSITY OF TEST STRIP CA...
- Publication number 20160381265
- Publication date Dec 29, 2016
- EHOME HEALTH INC.
- Ge CONG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
SYSTEMS AND METHODS FOR FAST TEST STRIP INTENSITY RECOGNITION
- Publication number 20140219885
- Publication date Aug 7, 2014
- Ge Cong
- G01 - MEASURING TESTING

Person

Patents Grantslast 30 patents

Deep learning based defect detection

Setting up inspection of a specimen

Image alignment for noisy images

System and method for determining type and size of defects on blank...

BBP assisted defect detection flow for SEM images

Cassette attachment device for detecting intensity of test strip ca...

Method for fast test strip intensity recognition

Detection of thin line for selective sensitivity during reticle ins...

Patents Applicationslast 30 patents

PROCESSING SENSOR DATA USING LANGUAGE MODELS IN MAP GENERATION SYST...

USING LANGUAGE MODELS TO VERIFY MAP DATA IN MAP GENERATION SYSTEMS...

USING LARGE LANGUAGE MODELS FOR SIMILARITY DETERMINATIONS IN CONTEN...

MULTIMODE DEFECT DETECTION

SYSTEM AND METHOD FOR OPTICAL WAFER CHARACTERIZATION WITH IMAGE UP...

Setting Up Inspection of a Specimen

DEEP LEARNING BASED DEFECT DETECTION

IMAGE ALIGNMENT FOR NOISY IMAGES

BBP Assisted Defect Detection Flow for SEM Images

System and Method for Determining Type and Size of Defects on Blank...

CASSETTE ATTACHMENT DEVICE FOR DETECTING INTENSITY OF TEST STRIP CA...

SYSTEMS AND METHODS FOR FAST TEST STRIP INTENSITY RECOGNITION