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Geert J. Wyntjes
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Chelsea, MA, US
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last 30 patents
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Patent Grant
Three-dimensional imaging system
Patent number
6,002,423
Issue date
Dec 14, 1999
Visidyne, Inc.
Saul Rappaport
G01 - MEASURING TESTING
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Patent Grant
Optical measurement system
Patent number
5,793,483
Issue date
Aug 11, 1998
Visidyne, Inc.
Theodore F. Zehnpfennig
G01 - MEASURING TESTING
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Patent Grant
Portable extended life metrology system for measuring scale displac...
Patent number
5,317,385
Issue date
May 31, 1994
Federal Products Corporation
John R. Silva
G01 - MEASURING TESTING