Gen OSHIYAMA

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Kawasaki, JP

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Patents Grantslast 30 patents

Information Patent Grant
Arithmetic processing apparatus and method for selecting an executa...
- Patent number 11,755,329
- Issue date Sep 12, 2023
- Fujitsu Limited
- Gen Oshiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test circuit and method for controlling test circuit
- Patent number 9,835,685
- Issue date Dec 5, 2017
- Fujitsu Limited
- Gen Oshiyama
- G11 - INFORMATION STORAGE
Information Patent Grant
Test circuit and method of controlling test circuit
- Patent number 9,797,949
- Issue date Oct 24, 2017
- Fujitsu Limited
- Gen Oshiyama
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of testing semiconductor device
- Patent number 9,746,878
- Issue date Aug 29, 2017
- Fujitsu Limited
- Gen Oshiyama
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
ARITHMETIC PROCESSING APPARATUS AND METHOD FOR ARITHMETIC PROCESSING
- Publication number 20230315446
- Publication date Oct 5, 2023
- Fujitsu Limited
- Gen Oshiyama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ARITHMETIC PROCESSING APPARATUS AND METHOD OF CONTROLLING ARITHMETI...
- Publication number 20200183684
- Publication date Jun 11, 2020
- Fujitsu Limited
- Gen OSHIYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST CIRCUIT AND METHOD OF CONTROLLING TEST CIRCUIT
- Publication number 20160187421
- Publication date Jun 30, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20160154049
- Publication date Jun 2, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND METHOD FOR CONTROLLING TEST CIRCUIT
- Publication number 20160154057
- Publication date Jun 2, 2016
- Fujitsu Limited
- Gen OSHIYAMA
- G01 - MEASURING TESTING