Gen TSUKISHIRO

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Kasugai, JP

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Patents Grantslast 30 patents

Information Patent Grant
Data transfer device
- Patent number 9,262,314
- Issue date Feb 16, 2016
- Socionext, Inc.
- Yusuke Okajima
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Cache device
- Patent number 8,661,198
- Issue date Feb 25, 2014
- Fujitsu Semiconductor Limited
- Gen Tsukishiro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cache device
- Patent number 8,380,934
- Issue date Feb 19, 2013
- Fujitsu Semiconductor Limited
- Gen Tsukishiro
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device and method for testing semiconductor device
- Patent number 7,482,830
- Issue date Jan 27, 2009
- Fujitsu Microelectronics Limited
- Gen Tsukishiro
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device and method for testing semiconductor device
- Patent number 7,248,068
- Issue date Jul 24, 2007
- Fujitsu Limited
- Gen Tsukishiro
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory control device and memory control method
- Patent number 7,042,798
- Issue date May 9, 2006
- Fujitsu Limited
- Yoshiharu Kato
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DATA TRANSFER DEVICE
- Publication number 20140059317
- Publication date Feb 27, 2014
- FUJITSU SEMICONDUCTOR LIMITED
- Yusuke OKAJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CACHE DEVICE
- Publication number 20130019066
- Publication date Jan 17, 2013
- Fujitsu Semiconductor Limited
- Gen TSUKISHIRO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CACHE DEVICE
- Publication number 20100211746
- Publication date Aug 19, 2010
- FUJITSU MICROELECTRONICS LIMITED
- Gen TSUKISHIRO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Semiconductor device and method for testing semiconductor device
- Publication number 20070241767
- Publication date Oct 18, 2007
- FUJITSU LIMITED
- Gen Tsukishiro
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and method for testing semiconductor device
- Publication number 20060224923
- Publication date Oct 5, 2006
- FUJITSU LIMITED
- Gen Tsukishiro
- G01 - MEASURING TESTING
Information Patent Application
Memory control device and memory control method
- Publication number 20050157585
- Publication date Jul 21, 2005
- FUJITSU LIMITED
- Yoshiharu Kato
- G06 - COMPUTING CALCULATING COUNTING