Gene T. Patrick

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Richmond, VT, US

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Patents Grantslast 30 patents

Information Patent Grant
Structure for coupling probes of probe device to corresponding elec...
- Patent number 7,456,640
- Issue date Nov 25, 2008
- International Business Machines Corporation
- Ronald Richard Breton
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for preventing cross talk and interference in semiconduct...
- Patent number 7,026,806
- Issue date Apr 11, 2006
- International Business Machines Corporation
- John M. Blondin
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor test and burn-in apparatus provided with a high curre...
- Patent number 6,921,288
- Issue date Jul 26, 2005
- International Business Machines Corporation
- John M. Blondin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Calibration system and method for receiver guardband reductions
- Patent number 6,347,287
- Issue date Feb 12, 2002
- International Business Machines Corporation
- Michael F. Beckett
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Structure for coupling probes of probe device to corresponding elec...
- Publication number 20070200572
- Publication date Aug 30, 2007
- Ronald Richard Breton
- G01 - MEASURING TESTING
Information Patent Application
A SEMICONDUCTOR TEST AND BURN-IN APPARATUS PROVIDED WITH A HIGH CUR...
- Publication number 20050112936
- Publication date May 26, 2005
- International Business Machines Corporation
- John M. Blondin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR PREVENTING CROSS TALK AND INTERFERENCE IN SEMICONDUCT...
- Publication number 20040262603
- Publication date Dec 30, 2004
- International Business Machines Corporation
- John M. Blondin
- G01 - MEASURING TESTING