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Gene Tokraks
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Gilbert, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Interconnect assembly for a probe card
Patent number
7,217,139
Issue date
May 15, 2007
Antares Advanced Test Technologies, Inc.
Jim Jaquette
G01 - MEASURING TESTING
Information
Patent Grant
See-saw interconnect assembly with dielectric carrier grid providin...
Patent number
7,189,078
Issue date
Mar 13, 2007
Antares conTech, Inc.
January Kister
G01 - MEASURING TESTING
Information
Patent Grant
See-saw interconnect assembly with dielectric carrier grid providin...
Patent number
7,059,865
Issue date
Jun 13, 2006
K&S Interconnect, Inc.
January Kister
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Interconnect assembly for a probe card
Publication number
20060035485
Publication date
Feb 16, 2006
K&S Interconnect, Inc.
Jim Jaquette
G01 - MEASURING TESTING
Information
Patent Application
SEE-SAW INTERCONNECT ASSEMBLY WITH DIELECTRIC CARRIER GRID PROVIDIN...
Publication number
20050159025
Publication date
Jul 21, 2005
January Kister
G01 - MEASURING TESTING
Information
Patent Application
See-saw interconnect assembly with dielectric carrier grid providin...
Publication number
20050159027
Publication date
Jul 21, 2005
January Kister
G01 - MEASURING TESTING