Geng Han

Person

Fishkill, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Metallization lines on integrated circuit products
- Patent number 12,131,994
- Issue date Oct 29, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metallization lines on integrated circuit products
- Patent number 11,791,263
- Issue date Oct 17, 2023
- GLOBALFOUNDRIES U.S. INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Addressing layout retargeting shortfalls
- Patent number 11,574,103
- Issue date Feb 7, 2023
- International Business Machines Corporation
- Dongbing Shao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Metallization lines on integrated circuit products
- Patent number 11,233,006
- Issue date Jan 25, 2022
- GLOBALFOUNDRIES U.S. INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid optical and EUV lithography
- Patent number 11,061,315
- Issue date Jul 13, 2021
- GLOBALFOUNDRIES U.S. Inc.
- Jia Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Structure design generation for fixing metal tip-to-tip across cell...
- Patent number 10,534,258
- Issue date Jan 14, 2020
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure design generation for fixing metal tip-to-tip across cell...
- Patent number 10,527,932
- Issue date Jan 7, 2020
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure design generation for fixing metal tip-to-tip across cell...
- Patent number 10,248,017
- Issue date Apr 2, 2019
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dummy pattern addition to improve CD uniformity
- Patent number 10,170,309
- Issue date Jan 1, 2019
- GLOBALFOUNDRIES Inc.
- Daniel J. Dechene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods of forming metallization lines on integrated circuit produc...
- Patent number 10,079,173
- Issue date Sep 18, 2018
- GLOBALFOUNDRIES Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of simultaneous lithography and etch correction flow
- Patent number 9,910,348
- Issue date Mar 6, 2018
- GLOBALFOUNDRIES Inc.
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Structure design generation for fixing metal tip-to-tip across cell...
- Patent number 9,885,951
- Issue date Feb 6, 2018
- International Business Machines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Predicting process fail limits
- Patent number 9,471,743
- Issue date Oct 18, 2016
- GLOBALFOUNDRIES Inc.
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Patterning assist feature to mitigate reactive ion etch microloadin...
- Patent number 9,252,022
- Issue date Feb 2, 2016
- GLOBALFOUNDRIES Inc.
- Daniel J. Dechene
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for adjusting target layout based on intensity of background...
- Patent number 9,064,085
- Issue date Jun 23, 2015
- Samsung Electronics Co., Ltd.
- Sang Yil Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for generating post-OPC layout in consideration of top loss...
- Patent number 8,856,695
- Issue date Oct 7, 2014
- Samsung Electronics Co., Ltd.
- Sang Yil Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Block mask decomposition for mitigating corner rounding
- Patent number 8,584,060
- Issue date Nov 12, 2013
- International Business Machines Corporation
- William Brearley
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Decomposition with multiple exposures in a process window based OPC...
- Patent number 8,392,871
- Issue date Mar 5, 2013
- International Business Machines Corporation
- Scott M. Mansfield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Placement and optimization of process dummy cells
- Patent number 8,347,246
- Issue date Jan 1, 2013
- International Business Machines Corporation
- Xu Ouyang
- G11 - INFORMATION STORAGE
Information Patent Grant
Placement and optimization of process dummy cells
- Patent number 8,225,255
- Issue date Jul 17, 2012
- International Business Machines Corporation
- Xu Ouyang
- G11 - INFORMATION STORAGE
Information Patent Grant
Calibration of lithographic process models
- Patent number 8,174,681
- Issue date May 8, 2012
- International Business Machines Corporation
- Ioana Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimizing integrated circuit chip designs for optical proximity co...
- Patent number 8,122,387
- Issue date Feb 21, 2012
- International Business Macines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Test pattern based process model calibration
- Patent number 7,895,547
- Issue date Feb 22, 2011
- International Business Machines Corporation
- Scott M Mansfield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for separating optical and resist effects in process models
- Patent number 7,642,020
- Issue date Jan 5, 2010
- International Business Machines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Closed-loop design for manufacturability process
- Patent number 7,624,369
- Issue date Nov 24, 2009
- International Business Machines Corporation
- Ioana Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS
- Publication number 20240413082
- Publication date Dec 12, 2024
- GLOBALFOUNDRIES U.S. Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS
- Publication number 20230395502
- Publication date Dec 7, 2023
- GLOBALFOUNDRIES U.S. Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR FORMING CONTINUOUS LINE-END TO LINE-END SPACES WITH SPAC...
- Publication number 20230314952
- Publication date Oct 5, 2023
- International Business Machines Corporation
- Allen GABOR
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS
- Publication number 20220108950
- Publication date Apr 7, 2022
- GLOBALFOUNDRIES U.S. Inc.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADDRESSING LAYOUT RETARGETING SHORTFALLS
- Publication number 20210240899
- Publication date Aug 5, 2021
- International Business Machines Corporation
- Dongbing Shao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HYBRID OPTICAL AND EUV LITHOGRAPHY
- Publication number 20200159105
- Publication date May 21, 2020
- GLOBALFOUNDRIES INC.
- Jia Zeng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...
- Publication number 20190155148
- Publication date May 23, 2019
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...
- Publication number 20190137867
- Publication date May 9, 2019
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS
- Publication number 20190006232
- Publication date Jan 3, 2019
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DUMMY PATTERN ADDITION TO IMPROVE CD UNIFORMITY
- Publication number 20180233361
- Publication date Aug 16, 2018
- GLOBALFOUNDRIES INC.
- Daniel J. DECHENE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS OF FORMING METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUC...
- Publication number 20180096932
- Publication date Apr 5, 2018
- GLOBALFOUNDRIES INC.
- Ruilong Xie
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...
- Publication number 20180067391
- Publication date Mar 8, 2018
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...
- Publication number 20170168386
- Publication date Jun 15, 2017
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF SIMULTANEOUS LITHOGRAPHY AND ETCH CORRECTION FLOW
- Publication number 20170004233
- Publication date Jan 5, 2017
- GLOBALFOUNDRIES INC.
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTING PROCESS FAIL LIMITS
- Publication number 20160292342
- Publication date Oct 6, 2016
- International Business Machines Corporation
- Geng Han
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF FORMING A SEMICONDUCTOR CIRCUIT
- Publication number 20150007119
- Publication date Jan 1, 2015
- International Business Machines Corporation
- Sang Yil Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR GENERATING POST-OPC LAYOUT IN CONSIDERATION OF TOP LOSS...
- Publication number 20140282297
- Publication date Sep 18, 2014
- Samsung Electronics Co., Ltd.
- SANG YIL CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PLACEMENT AND OPTIMIZATION OF PROCESS DUMMY CELLS
- Publication number 20120192137
- Publication date Jul 26, 2012
- International Business Machines Corporation
- Xu Ouyang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DECOMPOSITION WITH MULTIPLE EXPOSURES IN A PROCESS WINDOW BASED OPC...
- Publication number 20110271238
- Publication date Nov 3, 2011
- International Business Machines Corporation
- Scott M. Mansfield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF INTEGRATED CIRCUIT CHIP FABRICATION AND PROGRAM PRODUCT T...
- Publication number 20100318956
- Publication date Dec 16, 2010
- International Business Machines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CALIBRATION OF LITHOGRAPHIC PROCESS MODELS
- Publication number 20100171031
- Publication date Jul 8, 2010
- International Business Machines Corporation
- Ioana Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PLACEMENT AND OPTIMIZATION OF PROCESS DUMMY CELLS
- Publication number 20090290401
- Publication date Nov 26, 2009
- International Business Machines Corporation
- Xu Ouyang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Test Pattern Based Process Model Calibration
- Publication number 20090276736
- Publication date Nov 5, 2009
- International Business Machines Corporation
- Scott M. Mansfield
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
CLOSED-LOOP DESIGN FOR MANUFACTURABILITY PROCESS
- Publication number 20080127029
- Publication date May 29, 2008
- International Business Machines Corporation
- Ioana Graur
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR SEPARATING OPTICAL AND RESIST EFFECTS IN PROCESS MODELS
- Publication number 20080044748
- Publication date Feb 21, 2008
- International Business Machines Corporation
- Geng Han
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Person

Patents Grantslast 30 patents

Metallization lines on integrated circuit products

Metallization lines on integrated circuit products

Addressing layout retargeting shortfalls

Metallization lines on integrated circuit products

Hybrid optical and EUV lithography

Structure design generation for fixing metal tip-to-tip across cell...

Structure design generation for fixing metal tip-to-tip across cell...

Structure design generation for fixing metal tip-to-tip across cell...

Dummy pattern addition to improve CD uniformity

Methods of forming metallization lines on integrated circuit produc...

Method of simultaneous lithography and etch correction flow

Structure design generation for fixing metal tip-to-tip across cell...

Predicting process fail limits

Patterning assist feature to mitigate reactive ion etch microloadin...

Method for adjusting target layout based on intensity of background...

Method for generating post-OPC layout in consideration of top loss...

Block mask decomposition for mitigating corner rounding

Decomposition with multiple exposures in a process window based OPC...

Placement and optimization of process dummy cells

Placement and optimization of process dummy cells

Calibration of lithographic process models

Optimizing integrated circuit chip designs for optical proximity co...

Test pattern based process model calibration

Method for separating optical and resist effects in process models

Closed-loop design for manufacturability process

Patents Applicationslast 30 patents

METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS

METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS

METHOD FOR FORMING CONTINUOUS LINE-END TO LINE-END SPACES WITH SPAC...

METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS

ADDRESSING LAYOUT RETARGETING SHORTFALLS

HYBRID OPTICAL AND EUV LITHOGRAPHY

STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...

STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...

METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUCTS

DUMMY PATTERN ADDITION TO IMPROVE CD UNIFORMITY

METHODS OF FORMING METALLIZATION LINES ON INTEGRATED CIRCUIT PRODUC...

STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...

STRUCTURE DESIGN GENERATION FOR FIXING METAL TIP-TO-TIP ACROSS CELL...

METHOD OF SIMULTANEOUS LITHOGRAPHY AND ETCH CORRECTION FLOW

PREDICTING PROCESS FAIL LIMITS

METHOD OF FORMING A SEMICONDUCTOR CIRCUIT

METHOD FOR GENERATING POST-OPC LAYOUT IN CONSIDERATION OF TOP LOSS...

PLACEMENT AND OPTIMIZATION OF PROCESS DUMMY CELLS

DECOMPOSITION WITH MULTIPLE EXPOSURES IN A PROCESS WINDOW BASED OPC...

METHOD OF INTEGRATED CIRCUIT CHIP FABRICATION AND PROGRAM PRODUCT T...

CALIBRATION OF LITHOGRAPHIC PROCESS MODELS

PLACEMENT AND OPTIMIZATION OF PROCESS DUMMY CELLS

Test Pattern Based Process Model Calibration

CLOSED-LOOP DESIGN FOR MANUFACTURABILITY PROCESS

METHOD FOR SEPARATING OPTICAL AND RESIST EFFECTS IN PROCESS MODELS