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GenJun Ji
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Changzhou, CN
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last 30 patents
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Patent Grant
Center of gravity offset detection method and platform scale
Patent number
10,782,201
Issue date
Sep 22, 2020
Mettler-Toledo (Changzhou) Measurement Technology Co. Ltd
ZhiQiang Wang
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
METHOD AND SYSTEM FOR ECCENTRIC LOAD ERROR CORRECTION
Publication number
20230266158
Publication date
Aug 24, 2023
METTLER TOLEDO (CHANGZHOU) MEASUREMENT TECHNOLOGY LTD.
Shenhui Wang
G01 - MEASURING TESTING
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Patent Application
CENTER OF GRAVITY OFFSET DETECTION METHOD AND PLATFORM SCALE
Publication number
20180340856
Publication date
Nov 29, 2018
Metter-Toledo (Changzhou) Measurement Technology Co. Ltd.
ZhiQiang Wang
G01 - MEASURING TESTING