Genki Kinugasa

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Radiation detection apparatus and sample analysis apparatus
- Patent number 12,105,229
- Issue date Oct 1, 2024
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray fluorescence measurement apparatus
- Patent number 11,549,896
- Issue date Jan 10, 2023
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Grant
Analysis method and X-ray fluorescence analyzer
- Patent number 11,499,927
- Issue date Nov 15, 2022
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector and sample analyzer
- Patent number 9,268,036
- Issue date Feb 23, 2016
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectrometer and sample analyzer
- Patent number 9,188,552
- Issue date Nov 17, 2015
- Jeol Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Sample Container and Measuring Method
- Publication number 20230408427
- Publication date Dec 21, 2023
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
Radiation Detection Apparatus and Sample Analysis Apparatus
- Publication number 20230112252
- Publication date Apr 13, 2023
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
Analysis Method and X-Ray Fluorescence Analyzer
- Publication number 20210302336
- Publication date Sep 30, 2021
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Measurement Apparatus
- Publication number 20210018453
- Publication date Jan 21, 2021
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Fluorescence Analysis Apparatus and Calibration Method Thereof
- Publication number 20210003520
- Publication date Jan 7, 2021
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Spectrometer and Sample Analyzer
- Publication number 20150276630
- Publication date Oct 1, 2015
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING
Information Patent Application
Radiation Detector and Sample Analyzer
- Publication number 20150083913
- Publication date Mar 26, 2015
- JEOL Ltd.
- Genki Kinugasa
- G01 - MEASURING TESTING