Gennady Ofengenden

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Kiryat Yam, IL

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Patents Applicationslast 30 patents

Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20110164730
- Publication date Jul 7, 2011
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING