Gennady Openganden

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Kiryat Yam, IL

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Patents Grantslast 30 patents

Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,731,138
- Issue date May 20, 2014
- Jordan Valley Semiconductor Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Grant
Enhancing accuracy of fast high-resolution X-ray diffractometry
- Patent number 8,687,766
- Issue date Apr 1, 2014
- Jordan Valley Semiconductors Ltd.
- Matthew Wormington
- G01 - MEASURING TESTING
Information Patent Grant
High-resolution X-ray diffraction measurement with enhanced sensiti...
- Patent number 8,243,878
- Issue date Aug 14, 2012
- Jordan Valley Semiconductors Ltd.
- Boris Yokhin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High-Resolution X-Ray Diffraction Measurement with Enhanced Sensiti...
- Publication number 20120281814
- Publication date Nov 8, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Boris Yokhin
- G01 - MEASURING TESTING
Information Patent Application
ENHANCING ACCURACY OF FAST HIGH-RESOLUTION X-RAY DIFFRACTOMETRY
- Publication number 20120014508
- Publication date Jan 19, 2012
- JORDAN VALLEY SEMICONDUCTORS LTD.
- Matthew Wormington
- G01 - MEASURING TESTING