Gentaro ISHIHARA

Person

Tachikawa-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Spectrum correction device, spectrum correction method, and non-tra...
- Patent number 10,983,004
- Issue date Apr 20, 2021
- Yokogawa Electric Corporation
- Gentaro Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device
- Patent number 10,754,990
- Issue date Aug 25, 2020
- Yokogawa Electric Corporation
- Gentaro Ishihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement device and method for displaying measurement result
- Patent number 7,456,626
- Issue date Nov 25, 2008
- Yokogawa Electric Corporation
- Gentaro Ishihara
- G01 - MEASURING TESTING
Information Patent Grant
Noise figure-measuring device and noise figure-measuring method
- Patent number 6,898,001
- Issue date May 24, 2005
- Ando Electric Co., Ltd.
- Gentaro Ishihara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Method and apparatus for analyzing wavelength-division multiplexed...
- Patent number 6,707,547
- Issue date Mar 16, 2004
- Ando Electric Co., Ltd.
- Gentaro Ishihara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Patents Applicationslast 30 patents

Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM
- Publication number 20240385041
- Publication date Nov 21, 2024
- YOKOGAWA ELECTRIC CORPORATION
- Gentaro Ishihara
- G01 - MEASURING TESTING
Information Patent Application
SPECTRUM CORRECTION DEVICE, SPECTRUM CORRECTION METHOD, AND NON-TRA...
- Publication number 20190323887
- Publication date Oct 24, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Gentaro ISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20170076115
- Publication date Mar 16, 2017
- YOKOGAWA ELECTRIC CORPORATION
- Gentaro ISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASURING APPARATUS AND OPTICAL MEASURING METHOD
- Publication number 20150057977
- Publication date Feb 26, 2015
- Yokogawa Meters & Instruments Corporation
- Gentaro ISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
Measurement device and method for displaying measurement result
- Publication number 20050179683
- Publication date Aug 18, 2005
- Gentaro Ishihara
- G01 - MEASURING TESTING
Information Patent Application
Noise figure-measuring device and noise figure-measuring method
- Publication number 20020089665
- Publication date Jul 11, 2002
- Gentaro Ishihara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and apparatus for analyzing wavelength-division multiplexed...
- Publication number 20020005948
- Publication date Jan 17, 2002
- Gentaro Ishihara
- H04 - ELECTRIC COMMUNICATION TECHNIQUE

Gentaro ISHIHARA

Person

Patents Grantslast 30 patents

Spectrum correction device, spectrum correction method, and non-tra...

Electronic device

Measurement device and method for displaying measurement result

Noise figure-measuring device and noise figure-measuring method

Method and apparatus for analyzing wavelength-division multiplexed...

Patents Applicationslast 30 patents

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM

SPECTRUM CORRECTION DEVICE, SPECTRUM CORRECTION METHOD, AND NON-TRA...

ELECTRONIC DEVICE

OPTICAL MEASURING APPARATUS AND OPTICAL MEASURING METHOD

Measurement device and method for displaying measurement result

Noise figure-measuring device and noise figure-measuring method

Method and apparatus for analyzing wavelength-division multiplexed...