Geoffrey D. Duerden

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Montreal, CA

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Patents Grantslast 30 patents

Information Patent Grant
System and method for generating a jittered test signal
- Patent number 7,315,574
- Issue date Jan 1, 2008
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
System and method for testing integrated circuits
- Patent number 7,242,209
- Issue date Jul 10, 2007
- DFT Microsystems, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
System and Method for Physical-Layer Testing of High-Speed Serial L...
- Publication number 20080192814
- Publication date Aug 14, 2008
- DFT Microsystems, Inc.
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for generating a jittered test signal
- Publication number 20050271131
- Publication date Dec 8, 2005
- Mohamed M. Hafed
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
System and method for testing integrated circuits
- Publication number 20050253617
- Publication date Nov 17, 2005
- DFT Microsystems Canada, Inc.
- Gordon W. Roberts
- G01 - MEASURING TESTING