Geoffrey Herrick

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Portland, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for probe tip contact
- Patent number 7,161,366
- Issue date Jan 9, 2007
- Tektronix, Inc.
- Geoffrey Herrick
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for probing a microwave circuit
- Patent number 4,965,514
- Issue date Oct 23, 1990
- Tektronix, Inc.
- Geoffrey C. Herrick
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and apparatus for probe tip contact
- Publication number 20060103400
- Publication date May 18, 2006
- Geoffrey Herrick
- G01 - MEASURING TESTING