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Georg Ernest Fantner
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Chavannes-pres-Renens, CH
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Patents Grants
last 30 patents
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Patent Grant
Method and device of using a scanning probe microscope
Patent number
11,112,426
Issue date
Sep 7, 2021
Ecole Polytechnique Federale de Lausanne (EPFL)
Georg Ernest Fantner
G01 - MEASURING TESTING
Information
Patent Grant
Multilayer MEMS cantilevers
Patent number
10,308,500
Issue date
Jun 4, 2019
Ecole Polytechnique Federale de Lausanne (EPFL)
Georg Ernest Fantner
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Resonance compensation in scanning probe microscopy
Patent number
8,347,409
Issue date
Jan 1, 2013
Massachusetts Institute of Technology
Daniel James Burns
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
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Patent Application
MULTILAYER MEMS CANTILEVERS
Publication number
20180141801
Publication date
May 24, 2018
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
Georg Ernest FANTNER
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
Method and Device of Using a Scanning Probe Microscope
Publication number
20180106830
Publication date
Apr 19, 2018
ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
Georg Ernest Fantner
G01 - MEASURING TESTING
Information
Patent Application
RESONANCE COMPENSATION IN SCANNING PROBE MICROSCOPY
Publication number
20110289635
Publication date
Nov 24, 2011
Massachusetts Institute of Technology
Daniel James Burns
G01 - MEASURING TESTING