Georg Muller

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Munchen, DE

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Patents Grantslast 30 patents

Information Patent Grant
Semi-conductor component test process and a system for testing semi...
- Patent number 7,265,568
- Issue date Sep 4, 2007
- Infineon Technologies AG
- Michael Kund
- G11 - INFORMATION STORAGE
Information Patent Grant
Semi-conductor component testing process and system for testing sem...
- Patent number 7,230,442
- Issue date Jun 12, 2007
- Infineon Technologies AG
- Georg Müller
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor device testing apparatus, semiconductor device testin...
- Patent number 7,126,326
- Issue date Oct 24, 2006
- Infineon Technologies AG
- Georg Muller
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
Input/output switching arrangement for semiconductor circuits, a me...
- Publication number 20050108606
- Publication date May 19, 2005
- Georg Muller
- G01 - MEASURING TESTING
Information Patent Application
Semi-conductor component test process and a system for testing semi...
- Publication number 20050024058
- Publication date Feb 3, 2005
- Infineon Technologies AG
- Michael Kund
- G01 - MEASURING TESTING
Information Patent Application
Semi-conductor component testing process and system for testing sem...
- Publication number 20050017747
- Publication date Jan 27, 2005
- Infineon Technologies AG
- Georg Muller
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor device testing apparatus, semiconductor device testin...
- Publication number 20040124859
- Publication date Jul 1, 2004
- Georg Muller
- G01 - MEASURING TESTING