Georg Muller

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D-91094 Langensendelbach, DE

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Patents Grantslast 30 patents

Information Patent Grant
Process and device for measuring the oxygen potential in a silicon...
- Patent number 6,074,547
- Issue date Jun 13, 2000
- Wacker Siltronic Gesellschaft fur Halbleitermaterialien AG
- Georg Muller
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring and controlling the oxygen concentration in si...
- Patent number 5,723,337
- Issue date Mar 3, 1998
- Muller; Georg
- Georg Muller
- C30 - CRYSTAL GROWTH