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Georg Sulzer
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Dresden, DE
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Patents Grants
last 30 patents
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Patent Grant
Method of defining the dimensions of circuit elements by using spac...
Patent number
6,936,383
Issue date
Aug 30, 2005
Advanced Micro Devices, Inc.
Martin Mazur
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Low-k dielectric layer stack including an etch indicator layer for...
Patent number
6,927,161
Issue date
Aug 9, 2005
Advanced Micro Devices, Inc.
Hartmut Ruelke
H01 - BASIC ELECTRIC ELEMENTS
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Patent Grant
Method of inspecting a depth of an opening of a dielectric material...
Patent number
6,365,423
Issue date
Apr 2, 2002
Advanced Micro Devices, Inc.
Frank Heinlein
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Low-k dielectric layer stack including an etch indicator layer for...
Publication number
20040041239
Publication date
Mar 4, 2004
Hartmut Ruelke
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of defining the dimensions of circuit elements by using spac...
Publication number
20040002217
Publication date
Jan 1, 2004
Martin Mazur
H01 - BASIC ELECTRIC ELEMENTS