George B. Guckenberger

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods and systems for tuning a mass spectrometer
- Patent number 12,148,603
- Issue date Nov 19, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Axial CI source—off-axis electron beam
- Patent number 12,014,916
- Issue date Jun 18, 2024
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Compression nut or fitting with removable plunger for easily dislod...
- Patent number 11,767,938
- Issue date Sep 26, 2023
- Thermo Finnigan LLC.
- George B. Guckenberger
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
Methods and systems for tuning a mass spectrometer
- Patent number 11,282,685
- Issue date Mar 22, 2022
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for decoupling a capillary column from a gas chro...
- Patent number 10,802,003
- Issue date Oct 13, 2020
- Thermo Finnigan LLC.
- James M. Hitchcock
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Adjustable multipole assembly for a mass spectrometer
- Patent number 10,755,914
- Issue date Aug 25, 2020
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable multipole assembly for a mass spectrometer
- Patent number 10,566,180
- Issue date Feb 18, 2020
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Adjustable multipole assembly for a mass spectrometer
- Patent number 10,529,550
- Issue date Jan 7, 2020
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Reducing detector wear during calibration and tuning
- Patent number 10,515,789
- Issue date Dec 24, 2019
- Thermo Finnigan LLC.
- George B. Guckenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for mass calibration
- Patent number 10,438,782
- Issue date Oct 8, 2019
- Thermo Finnigan LLC.
- Scott T. Quarmby
- G01 - MEASURING TESTING
Information Patent Grant
Offline mass calibration
- Patent number 10,242,850
- Issue date Mar 26, 2019
- Thermo Finnigan LLC.
- Scott T. Quarmby
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for decoupling a capillary column from a gas chro...
- Patent number 10,184,924
- Issue date Jan 22, 2019
- Thermo Finnigan LLC.
- James M. Hitchcock
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system for decoupling a capillary column from a gas chro...
- Patent number 9,463,534
- Issue date Oct 11, 2016
- Thermo Finnigan LLC.
- James M. Hitchcock
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for selectively providing electrons in an ion...
- Patent number 7,902,529
- Issue date Mar 8, 2011
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Removable ion source that does not require venting of the vacuum ch...
- Patent number 7,709,790
- Issue date May 4, 2010
- Thermo Finnigan LLC.
- George B. Guckenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for scaling intensity data in a mass spectrometer
- Patent number 7,638,763
- Issue date Dec 29, 2009
- Thermo Finnigan LLC.
- George B. Guckenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for normalizing performance of an electron source
- Patent number 7,622,713
- Issue date Nov 24, 2009
- Thermo Finnigan LLC.
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed ion source for quadrupole mass spectrometer method
- Patent number 7,507,954
- Issue date Mar 24, 2009
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Efficient detection for ion traps
- Patent number 7,456,398
- Issue date Nov 25, 2008
- Thermo Finnigan LLC.
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Pulsed ion source for quadrupole mass spectrometer and method
- Patent number 7,323,682
- Issue date Jan 29, 2008
- Thermo Finnigan LLC.
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus for delivering calibration compounds to mass spectrometer...
- Patent number 6,635,885
- Issue date Oct 21, 2003
- Thermo Finnigan LLC.
- Edward B. McCauley
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LOCK MASS CORRECTION DURING CHROMATOGRAPHY VOID TIME
- Publication number 20240192183
- Publication date Jun 13, 2024
- Thermo Finnigan LLC
- George B. Guckenberger
- G01 - MEASURING TESTING
Information Patent Application
FERRULE SLEEVE FOR PREVENTING EXCESSIVE FERRULE DEFORMATION CAUSING...
- Publication number 20230280314
- Publication date Sep 7, 2023
- Thermo Finnigan LLC
- George B. Guckenberger
- G01 - MEASURING TESTING
Information Patent Application
AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM
- Publication number 20230230826
- Publication date Jul 20, 2023
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Compression Nut or Fitting with Removable Plunger for Easily Dislod...
- Publication number 20230029511
- Publication date Feb 2, 2023
- Thermo Finnigan LLC
- George B. GUCKENBERGER
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
AUTOSAMPLERS FOR SAMPLING LIQUIDS
- Publication number 20220268797
- Publication date Aug 25, 2022
- Thermo Finnigan LLC
- George B. GUCKENBERGER
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR TUNING A MASS SPECTROMETER
- Publication number 20220270867
- Publication date Aug 25, 2022
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM
- Publication number 20210175063
- Publication date Jun 10, 2021
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHODS AND SYSTEMS FOR TUNING A MASS SPECTROMETER
- Publication number 20210111013
- Publication date Apr 15, 2021
- Thermo Finnigan LLC
- Scott T. QUARMBY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTABLE MULTIPOLE ASSEMBLY FOR A MASS SPECTROMETER
- Publication number 20200111657
- Publication date Apr 9, 2020
- Thermo Finnigan LLC
- Edward B. McCAULEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ADJUSTABLE MULTIPOLE ASSEMBLY FOR A MASS SPECTROMETER
- Publication number 20200020518
- Publication date Jan 16, 2020
- Thermo Finnigan LLC
- Edward B. McCAULEY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OFFLINE MASS CALIBRATION
- Publication number 20190172692
- Publication date Jun 6, 2019
- Thermo Finnigan LLC
- Scott T. QUARMBY
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Decoupling a Capillary Column from a Gas Chro...
- Publication number 20190137459
- Publication date May 9, 2019
- Thermo Finnigan LLC
- James M. HITCHCOCK
- G01 - MEASURING TESTING
Information Patent Application
REDUCING DETECTOR WEAR DURING CALIBRATION AND TUNING
- Publication number 20180286647
- Publication date Oct 4, 2018
- Thermo Finnigan LLC
- George B. GUCKENBERGER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and System for Decoupling a Capillary Column from a Gas Chro...
- Publication number 20170010244
- Publication date Jan 12, 2017
- Thermo Finnigan LLC
- James M. HITCHCOCK
- G01 - MEASURING TESTING
Information Patent Application
OFFLINE MASS CALIBRATION
- Publication number 20160284527
- Publication date Sep 29, 2016
- Thermo Finnigan LLC
- Scott T. QUARMBY
- G01 - MEASURING TESTING
Information Patent Application
Method and System for Decoupling a Capillary Column from a Gas Chro...
- Publication number 20160031047
- Publication date Feb 4, 2016
- Thermo Finnigan LLC
- James M. Hitchcock
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
Removable Ion Source that does not Require Venting of the Vacuum Ch...
- Publication number 20090242747
- Publication date Oct 1, 2009
- George B. Guckenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Normalizing Performance of an Electron Source
- Publication number 20090194680
- Publication date Aug 6, 2009
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and Apparatus for Selectively Providing Electrons in an Ion...
- Publication number 20090032702
- Publication date Feb 5, 2009
- Scott T. Quarmby
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for scaling intensity data in a mass spectrometer
- Publication number 20080272288
- Publication date Nov 6, 2008
- George B. Guckenberger
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsed Ion Source for Quadrupole Mass Spectrometer and Method
- Publication number 20080087816
- Publication date Apr 17, 2008
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Efficient detection for ion traps
- Publication number 20080067361
- Publication date Mar 20, 2008
- Michael W. Senko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Pulsed ion source for quadrupole mass spectrometer and method
- Publication number 20060016978
- Publication date Jan 26, 2006
- Edward B. McCauley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Apparatus for delivering calibration compounds to mass spectrometer...
- Publication number 20020092979
- Publication date Jul 18, 2002
- Finnigan Corporation
- Edward B. McCauley
- G01 - MEASURING TESTING

George B. Guckenberger

Person

Patents Grantslast 30 patents

Methods and systems for tuning a mass spectrometer

Axial CI source—off-axis electron beam

Compression nut or fitting with removable plunger for easily dislod...

Methods and systems for tuning a mass spectrometer

Method and system for decoupling a capillary column from a gas chro...

Adjustable multipole assembly for a mass spectrometer

Adjustable multipole assembly for a mass spectrometer

Adjustable multipole assembly for a mass spectrometer

Reducing detector wear during calibration and tuning

Systems and methods for mass calibration

Offline mass calibration

Method and system for decoupling a capillary column from a gas chro...

Method and system for decoupling a capillary column from a gas chro...

Method and apparatus for selectively providing electrons in an ion...

Removable ion source that does not require venting of the vacuum ch...

Method and apparatus for scaling intensity data in a mass spectrometer

Method and apparatus for normalizing performance of an electron source

Pulsed ion source for quadrupole mass spectrometer method

Efficient detection for ion traps

Pulsed ion source for quadrupole mass spectrometer and method

Apparatus for delivering calibration compounds to mass spectrometer...

Patents Applicationslast 30 patents

LOCK MASS CORRECTION DURING CHROMATOGRAPHY VOID TIME

FERRULE SLEEVE FOR PREVENTING EXCESSIVE FERRULE DEFORMATION CAUSING...

AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM

Compression Nut or Fitting with Removable Plunger for Easily Dislod...

AUTOSAMPLERS FOR SAMPLING LIQUIDS

METHODS AND SYSTEMS FOR TUNING A MASS SPECTROMETER

AXIAL CI SOURCE - OFF-AXIS ELECTRON BEAM

METHODS AND SYSTEMS FOR TUNING A MASS SPECTROMETER

ADJUSTABLE MULTIPOLE ASSEMBLY FOR A MASS SPECTROMETER

ADJUSTABLE MULTIPOLE ASSEMBLY FOR A MASS SPECTROMETER

OFFLINE MASS CALIBRATION

Method and System for Decoupling a Capillary Column from a Gas Chro...

REDUCING DETECTOR WEAR DURING CALIBRATION AND TUNING

Method and System for Decoupling a Capillary Column from a Gas Chro...

OFFLINE MASS CALIBRATION

Method and System for Decoupling a Capillary Column from a Gas Chro...

Removable Ion Source that does not Require Venting of the Vacuum Ch...

Method and Apparatus for Normalizing Performance of an Electron Source

Method and Apparatus for Selectively Providing Electrons in an Ion...

Method and apparatus for scaling intensity data in a mass spectrometer

Pulsed Ion Source for Quadrupole Mass Spectrometer and Method

Efficient detection for ion traps

Pulsed ion source for quadrupole mass spectrometer and method

Apparatus for delivering calibration compounds to mass spectrometer...