George C. Epp

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Van Austyne, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method of optically inspecting surface structures on an...
- Patent number 6,292,260
- Issue date Sep 18, 2001
- ISOA, Inc.
- Youling Lin
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and method for leads of semiconductor devices
- Patent number 5,956,134
- Issue date Sep 21, 1999
- Semiconductor Technologies & Instruments, Inc.
- Rajiv Roy
- G01 - MEASURING TESTING
Information Patent Grant
Voice coil programmable wire tensioner
- Patent number 5,114,066
- Issue date May 19, 1992
- Texas Instruments Incorporated
- Gonzalo Amador
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR