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George Charles Correia
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Essex Junction, VT, US
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last 30 patents
Information
Patent Grant
Spring probe contactor for testing PGA devices
Patent number
6,441,632
Issue date
Aug 27, 2002
International Business Machines Corporation
George C. Correia
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
6,137,299
Issue date
Oct 24, 2000
International Business Machines Corporation
Robert R. Cadieux
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,672,980
Issue date
Sep 30, 1997
International Business Machines Corporation
Richard Gordon Charlton
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,659,256
Issue date
Aug 19, 1997
International Business Machines Corporation
Richard Gordon Charlton
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for testing integrated circuit chips
Patent number
5,528,159
Issue date
Jun 18, 1996
International Business Machine Corp.
Richard G. Charlton
G01 - MEASURING TESTING