George F. Walker

Person

New York, NY, US

People

Patents Grantslast 30 patents

Information Patent Grant
Reduction of entropic barrier of polyelectrolyte molecules in a nan...
- Patent number 10,612,084
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Gustavo A. Stolovitzky
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Reduction of entropic barrier of polyelectrolyte molecules in a nan...
- Patent number 10,612,085
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Gustavo A. Stolovitzky
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Empathy injection for question-answering systems
- Patent number 10,592,503
- Issue date Mar 17, 2020
- International Business Machines Corporation
- James R. Kozloski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Empathy injection for question-answering systems
- Patent number 9,471,623
- Issue date Oct 18, 2016
- International Business Machines Corporation
- James R. Kozloski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Empathy injection for question-answering systems
- Patent number 9,298,766
- Issue date Mar 29, 2016
- International Business Machines Corporation
- James R. Kozloski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controlled translocation of macromolecules employing a funnel nanop...
- Patent number 9,250,206
- Issue date Feb 2, 2016
- International Business Machines Corporation
- George F. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Controlled translocation of macromolecules employing a funnel nanop...
- Patent number 9,250,207
- Issue date Feb 2, 2016
- International Business Machines Corporation
- George F. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Super lattice/quantum well nanowires
- Patent number 8,878,259
- Issue date Nov 4, 2014
- International Business Machines Corporation
- Harold J. Hovel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
DNA sequencing using multiple metal layer structure with organic co...
- Patent number 8,764,968
- Issue date Jul 1, 2014
- International Business Machines Corporation
- Ali Afzali-Ardakani
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Charged entities as locomotive to control motion of polymers throug...
- Patent number 8,691,067
- Issue date Apr 8, 2014
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Charged entities as locomotive to control motion of polymers throug...
- Patent number 8,641,879
- Issue date Feb 4, 2014
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Super lattice/quantum well nanowires
- Patent number 8,273,591
- Issue date Sep 25, 2012
- International Business Machines Corporation
- Harold J. Hovel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Technology for fabrication of packaging interface substrate wafers...
- Patent number 7,880,305
- Issue date Feb 1, 2011
- International Business Machines Corporation
- Yu-Ting Cheng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for producing thermally matched probe assembly
- Patent number 7,546,670
- Issue date Jun 16, 2009
- International Business Machines Corporation
- Timothy J. Dalton
- G01 - MEASURING TESTING
Information Patent Grant
High density integrated circuit apparatus, test probe and methods o...
- Patent number 7,538,565
- Issue date May 26, 2009
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Grant
Flexible assembly of stacked chips
- Patent number 7,355,271
- Issue date Apr 8, 2008
- International Business Machines Corporation
- Richard P. Volant
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Silicon chip carrier with conductive through-vias and method for fa...
- Patent number 7,276,787
- Issue date Oct 2, 2007
- International Business Machines Corporation
- Daniel Charles Edelstein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density integral test probe
- Patent number 7,276,919
- Issue date Oct 2, 2007
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Grant
Forming of high aspect ratio conductive structure using injection m...
- Patent number 7,273,806
- Issue date Sep 25, 2007
- International Business Machines Corporation
- Robert A. Groves
- G01 - MEASURING TESTING
Information Patent Grant
High density space transformer and method of fabricating same
- Patent number 7,252,514
- Issue date Aug 7, 2007
- International Business Machines Corporation
- Samuel R. McKnight
- G01 - MEASURING TESTING
Information Patent Grant
Method to selectively cap interconnects with indium or tin bronzes...
- Patent number 7,115,996
- Issue date Oct 3, 2006
- International Business Machines Corporation
- Daniel C. Edelstein
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Fuse structure and method to form the same
- Patent number 6,927,472
- Issue date Aug 9, 2005
- International Business Machines Corporation
- David K. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Fuse structure and method to form the same
- Patent number 6,924,185
- Issue date Aug 2, 2005
- International Business Machines Corporation
- David K. Anderson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High density area array solder microjoining interconnect structure...
- Patent number 6,819,000
- Issue date Nov 16, 2004
- International Business Machines Corporation
- John Harold Magerlein
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method to selectively cap interconnects with indium or tin bronzes...
- Patent number 6,784,088
- Issue date Aug 31, 2004
- International Business Machines Corporation
- Daniel C. Edelstein
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Temporary device attach structure for test and burn in of microjoin...
- Patent number 6,747,472
- Issue date Jun 8, 2004
- International Business Machines Corporation
- John Harold Magerlein
- G01 - MEASURING TESTING
Information Patent Grant
High density raised stud microjoining system and methods of fabrica...
- Patent number 6,732,908
- Issue date May 11, 2004
- International Business Machines Corporation
- Bruce Kenneth Furman
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
High density area array solder microjoining interconnect structure...
- Patent number 6,661,098
- Issue date Dec 9, 2003
- International Business Machines Corporation
- John Harold Magerlein
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for testing chips on flat solder bumps
- Patent number 6,656,750
- Issue date Dec 2, 2003
- International Business Machines Corporation
- Madhav Datta
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for forming Co-W-P-Au films
- Patent number 6,646,345
- Issue date Nov 11, 2003
- International Business Machines Corporation
- Carlos Juan Sambucetti
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
EMPATHY INJECTION FOR QUESTION-ANSWERING SYSTEMS
- Publication number 20160357744
- Publication date Dec 8, 2016
- International Business Machines Corporation
- James R. Kozloski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REDUCTION OF ENTROPIC BARRIER OF POLYELECTROLYTE MOLECULES IN A NAN...
- Publication number 20150285764
- Publication date Oct 8, 2015
- International Business Machines Corporation
- Gustavo A. Stolovitzky
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
REDUCTION OF ENTROPIC BARRIER OF POLYELECTROLYTE MOLECULES IN A NAN...
- Publication number 20150284791
- Publication date Oct 8, 2015
- International Business Machines Corporation
- Gustavo A. Stolovitzky
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
EMPATHY INJECTION FOR QUESTION-ANSWERING SYSTEMS
- Publication number 20150100521
- Publication date Apr 9, 2015
- International Business Machines Corporation
- James R. Kozloski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EMPATHY INJECTION FOR QUESTION-ANSWERING SYSTEMS
- Publication number 20150099257
- Publication date Apr 9, 2015
- International Business Machines Corporation
- James R. Kozloski
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLED TRANSLOCATION OF MACROMOLECULES EMPLOYING A FUNNEL NANOP...
- Publication number 20140299473
- Publication date Oct 9, 2014
- International Business Machines Corporation
- George F. Walker
- G01 - MEASURING TESTING
Information Patent Application
CONTROLLED TRANSLOCATION OF MACROMOLECULES EMPLOYING A FUNNEL NANOP...
- Publication number 20140299474
- Publication date Oct 9, 2014
- International Business Machines Corporation
- George F. Walker
- G01 - MEASURING TESTING
Information Patent Application
CHARGED ENTITIES AS LOCOMOTIVE TO CONTROL MOTION OF POLYMERS THROUG...
- Publication number 20130068617
- Publication date Mar 21, 2013
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Application
CHARGED ENTITIES AS LOCOMOTIVE TO CONTROL MOTION OF POLYMERS THROUG...
- Publication number 20130068618
- Publication date Mar 21, 2013
- International Business Machines Corporation
- Stefan Harrer
- B82 - NANO-TECHNOLOGY
Information Patent Application
DNA SEQUENCING USING MULTIPLE METAL LAYER STRUCTURE WITH ORGANIC CO...
- Publication number 20130001082
- Publication date Jan 3, 2013
- International Business Machines Corporation
- Ali Afzali-Ardakani
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SUPER LATTICE/QUANTUM WELL NANOWIRES
- Publication number 20120286236
- Publication date Nov 15, 2012
- International Business Machines Corporation
- Harold J. HOVEL
- C30 - CRYSTAL GROWTH
Information Patent Application
DNA SEQUENCING USING MULTIPLE METAL LAYER STRUCTURE WITH ORGANIC CO...
- Publication number 20120193231
- Publication date Aug 2, 2012
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100052715
- Publication date Mar 4, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100045317
- Publication date Feb 25, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100045320
- Publication date Feb 25, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100045321
- Publication date Feb 25, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100045318
- Publication date Feb 25, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100045266
- Publication date Feb 25, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20100045324
- Publication date Feb 25, 2010
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20090315579
- Publication date Dec 24, 2009
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
Technology for fabrication of packaging interface substrate wafers...
- Publication number 20090302454
- Publication date Dec 10, 2009
- Yu- Ting Cheng
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SUPER LATTICE/QUANTUM WELL NANOWIRES
- Publication number 20090242869
- Publication date Oct 1, 2009
- IBM
- Harold J. Hovel
- C30 - CRYSTAL GROWTH
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20090128176
- Publication date May 21, 2009
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080129319
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080132094
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080129320
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080121879
- Publication date May 29, 2008
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080123310
- Publication date May 29, 2008
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080117612
- Publication date May 22, 2008
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING
Information Patent Application
HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...
- Publication number 20080116913
- Publication date May 22, 2008
- International Business Machines Corporation
- Brian Samuel Beaman
- G01 - MEASURING TESTING

George F. Walker

Person

Patents Grantslast 30 patents

Reduction of entropic barrier of polyelectrolyte molecules in a nan...

Reduction of entropic barrier of polyelectrolyte molecules in a nan...

Empathy injection for question-answering systems

Empathy injection for question-answering systems

Empathy injection for question-answering systems

Controlled translocation of macromolecules employing a funnel nanop...

Controlled translocation of macromolecules employing a funnel nanop...

Super lattice/quantum well nanowires

DNA sequencing using multiple metal layer structure with organic co...

Charged entities as locomotive to control motion of polymers throug...

Charged entities as locomotive to control motion of polymers throug...

Super lattice/quantum well nanowires

Technology for fabrication of packaging interface substrate wafers...

Method for producing thermally matched probe assembly

High density integrated circuit apparatus, test probe and methods o...

Flexible assembly of stacked chips

Silicon chip carrier with conductive through-vias and method for fa...

High density integral test probe

Forming of high aspect ratio conductive structure using injection m...

High density space transformer and method of fabricating same

Method to selectively cap interconnects with indium or tin bronzes...

Fuse structure and method to form the same

Fuse structure and method to form the same

High density area array solder microjoining interconnect structure...

Method to selectively cap interconnects with indium or tin bronzes...

Temporary device attach structure for test and burn in of microjoin...

High density raised stud microjoining system and methods of fabrica...

High density area array solder microjoining interconnect structure...

Method for testing chips on flat solder bumps

Method for forming Co-W-P-Au films

Patents Applicationslast 30 patents

EMPATHY INJECTION FOR QUESTION-ANSWERING SYSTEMS

REDUCTION OF ENTROPIC BARRIER OF POLYELECTROLYTE MOLECULES IN A NAN...

REDUCTION OF ENTROPIC BARRIER OF POLYELECTROLYTE MOLECULES IN A NAN...

EMPATHY INJECTION FOR QUESTION-ANSWERING SYSTEMS

EMPATHY INJECTION FOR QUESTION-ANSWERING SYSTEMS

CONTROLLED TRANSLOCATION OF MACROMOLECULES EMPLOYING A FUNNEL NANOP...

CONTROLLED TRANSLOCATION OF MACROMOLECULES EMPLOYING A FUNNEL NANOP...

CHARGED ENTITIES AS LOCOMOTIVE TO CONTROL MOTION OF POLYMERS THROUG...

CHARGED ENTITIES AS LOCOMOTIVE TO CONTROL MOTION OF POLYMERS THROUG...

DNA SEQUENCING USING MULTIPLE METAL LAYER STRUCTURE WITH ORGANIC CO...

SUPER LATTICE/QUANTUM WELL NANOWIRES

DNA SEQUENCING USING MULTIPLE METAL LAYER STRUCTURE WITH ORGANIC CO...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

Technology for fabrication of packaging interface substrate wafers...

SUPER LATTICE/QUANTUM WELL NANOWIRES

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...

HIGH DENSITY INTEGRATED CIRCUIT APPARATUS, TEST PROBE AND METHODS O...