George Logsdon

Person

Arlington, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Automated control of semiconductor wafer manufacturing based on ele...
- Patent number 9,235,413
- Issue date Jan 12, 2016
- National Semiconductor Corporation
- William MacDonald
- G05 - CONTROLLING REGULATING
Information Patent Grant
Manufacturing exception handling system
- Patent number 8,417,367
- Issue date Apr 9, 2013
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for providing automatic qualification interventio...
- Patent number 7,826,915
- Issue date Nov 2, 2010
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for dispensing material onto a semiconductor wafer
- Patent number 7,784,423
- Issue date Aug 31, 2010
- National Semiconductor Corporation
- George Logsdon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for allocating multi-function resources in a process system...
- Patent number 7,725,207
- Issue date May 25, 2010
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical user interface for compliance monitoring in semiconductor...
- Patent number 7,373,211
- Issue date May 13, 2008
- National Semiconductor Corporation
- George Logsdon
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for allocating multi-function resources for a wet...
- Patent number 7,184,850
- Issue date Feb 27, 2007
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods that monitor re-qualification indicia associate...
- Patent number 7,065,424
- Issue date Jun 20, 2006
- National Semiconductor Corporation
- William MacDonald
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for visualizing the use of resources in a process...
- Patent number 7,043,319
- Issue date May 9, 2006
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor wafer fabrication furnace idle monitor and method of...
- Patent number 7,043,317
- Issue date May 9, 2006
- National Semiconductor Corporation
- Darren Lee Rust
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for allocating multi-function resources for a wet...
- Patent number 6,961,634
- Issue date Nov 1, 2005
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical user interface for allocating multi-function resources in...
- Patent number 6,959,225
- Issue date Oct 25, 2005
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems for allocating multi-function resources in a process system...
- Patent number 6,957,113
- Issue date Oct 18, 2005
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Graphical user interface for compliance monitoring in semiconductor...
- Patent number 6,957,114
- Issue date Oct 18, 2005
- National Semiconductor Corporation
- George Logsdon
- G06 - COMPUTING CALCULATING COUNTING

George Logsdon

Person

Patents Grantslast 30 patents

Automated control of semiconductor wafer manufacturing based on ele...

Manufacturing exception handling system

System and method for providing automatic qualification interventio...

System and method for dispensing material onto a semiconductor wafer

Systems for allocating multi-function resources in a process system...

Graphical user interface for compliance monitoring in semiconductor...

System and method for allocating multi-function resources for a wet...

Systems and methods that monitor re-qualification indicia associate...

System and method for visualizing the use of resources in a process...

Semiconductor wafer fabrication furnace idle monitor and method of...

System and method for allocating multi-function resources for a wet...

Graphical user interface for allocating multi-function resources in...

Systems for allocating multi-function resources in a process system...

Graphical user interface for compliance monitoring in semiconductor...