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George Papadopoulos
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Nesconset, NY, US
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Patents Grants
last 30 patents
Information
Patent Grant
Evanescent field coupled shock wave detection systems and methods
Patent number
11,841,266
Issue date
Dec 12, 2023
General Electric Company
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Grant
Evanescent field coupled shock wave detection systems and methods
Patent number
11,519,779
Issue date
Dec 6, 2022
Innoveering, LLC
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Grant
Plasma-based electro-optical sensing and methods
Patent number
11,469,082
Issue date
Oct 11, 2022
Innoveering, LLC
George Papadopoulos
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma-based electro-optical sensing and methods
Patent number
11,153,960
Issue date
Oct 19, 2021
Innoveering, LLC
George Papadopoulos
G01 - MEASURING TESTING
Information
Patent Grant
Optical coupled sensors for harsh environments
Patent number
9,391,216
Issue date
Jul 12, 2016
Orbital ATK, Inc.
George Papadopoulos
G01 - MEASURING TESTING
Information
Patent Grant
Non-intrusive sensor for in-situ measurement of recession rate of a...
Patent number
8,627,724
Issue date
Jan 14, 2014
Alliant Techsystems Inc.
George Papadopoulos
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
SHOCK WAVE DETECTION SYSTEMS AND METHODS
Publication number
20240247975
Publication date
Jul 25, 2024
GENERAL ELECTRIC COMPANY
Daniel BIVOLARU
G01 - MEASURING TESTING
Information
Patent Application
EVANESCENT FIELD COUPLED SHOCK WAVE DETECTION SYSTEMS AND METHODS
Publication number
20220390273
Publication date
Dec 8, 2022
Innoveering, LLC
Daniel Bivolaru
G01 - MEASURING TESTING
Information
Patent Application
NON-INTRUSIVE SENSOR FOR IN-SITU MEASUREMENT OF RECESSION RATE OF A...
Publication number
20120085173
Publication date
Apr 12, 2012
ALLIANT TECHSYSTEMS INC.
George Papadopoulos
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL COUPLED SENSORS FOR HARSH ENVIRONMENTS
Publication number
20090302242
Publication date
Dec 10, 2009
ALLIANT TECHSYSTEMS INC.
George Papadopoulos
G01 - MEASURING TESTING