George Q. Chen

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Fremont, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Closed region defect detection system
- Patent number 7,499,156
- Issue date Mar 3, 2009
- KLA-Tencor Technologies Corporation
- George Q. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Visualization of photomask databases
- Patent number 7,167,185
- Issue date Jan 23, 2007
- KLA-Tencor Technologies Corporation
- Lih-Huah Yiin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Closed region defect detection system
- Patent number 7,126,681
- Issue date Oct 24, 2006
- KLA-Tencor Technologies Corporation
- George Q. Chen
- G01 - MEASURING TESTING
Information Patent Grant
Surface inspection system and method using summed light analysis of...
- Patent number 7,046,352
- Issue date May 16, 2006
- KLA-Tencor Technologies Corporation
- Aditya Dayal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple design database layer inspection
- Patent number 7,027,635
- Issue date Apr 11, 2006
- KLA-Tencor Technologies Corporation
- Mark J. Wihl
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Closed region defect detection system
- Publication number 20070035727
- Publication date Feb 15, 2007
- KLA-Tencor Corporation
- George Q. Chen
- G01 - MEASURING TESTING