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George Reeves
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Sherman, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Routing engine, method of routing a test probe and testing system e...
Patent number
7,598,759
Issue date
Oct 6, 2009
Texas Instruments Incorporated
Rex W. Pirkle
G01 - MEASURING TESTING
Information
Patent Grant
Selective trim and wafer testing of integrated circuits
Patent number
6,872,582
Issue date
Mar 29, 2005
Texas Instruments Incorporated
Rex W. Pirkle
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Multiprobe blob test in lieu of 100% probe test
Patent number
6,834,246
Issue date
Dec 21, 2004
Texas Instruments Incorporated
Todd D. Stubblefield
G01 - MEASURING TESTING
Information
Patent Grant
System and method for determining a position error in a wafer handl...
Patent number
6,718,227
Issue date
Apr 6, 2004
Texas Instruments Incorporated
Floyd F. Schemmel
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
ROUTING ENGINE, METHOD OF ROUTING A TEST PROBE AND TESTING SYSTEM E...
Publication number
20080106286
Publication date
May 8, 2008
TEXAS INSTRUMENTS INCORPORATED
Rex W. Pirkle
G01 - MEASURING TESTING
Information
Patent Application
Multiprobe blob test in lieu of 100% probe test
Publication number
20040034493
Publication date
Feb 19, 2004
Todd D. Stubblefield
G01 - MEASURING TESTING
Information
Patent Application
Selective trim and wafer testing of integrated circuits
Publication number
20030169064
Publication date
Sep 11, 2003
Rex W. Pirkle
H01 - BASIC ELECTRIC ELEMENTS