George S. Prokop

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Dutchess County, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method for chip testing
- Patent number 6,730,529
- Issue date May 4, 2004
- International Business Machines Corporation
- Howard L. Kalter
- G01 - MEASURING TESTING
Information Patent Grant
Method of producing planar metal-to-metal capacitor for use in inte...
- Patent number 6,069,051
- Issue date May 30, 2000
- International Business Machines Corporation
- Du B. Nguyen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for chip testing
- Patent number 5,899,703
- Issue date May 4, 1999
- International Business Machines Corporation
- Howard L. Kalter
- G01 - MEASURING TESTING
Information Patent Grant
Structure for inhibiting forward bias beta degradation
- Patent number 4,577,212
- Issue date Mar 18, 1986
- International Business Machines Corporation
- Gary R. Hueckel
- H01 - BASIC ELECTRIC ELEMENTS