George S. Walker

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Beaverton, OR, US

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Patents Grantslast 30 patents

Information Patent Grant
High waveform throughput with a large acquisition memory
- Patent number 8,374,811
- Issue date Feb 12, 2013
- Tektronix, Inc.
- Steven K. Sullivan
- G01 - MEASURING TESTING
Information Patent Grant
Rasterization control method
- Patent number 5,995,117
- Issue date Nov 30, 1999
- Tektronix, Inc.
- Kenneth P. Dobyns
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel trigger dejitter
- Patent number 5,352,976
- Issue date Oct 4, 1994
- Tektronix, Inc.
- George S. Walker
- G01 - MEASURING TESTING
Information Patent Grant
Waveform timing alignment system for digital oscilloscopes
- Patent number 4,843,309
- Issue date Jun 27, 1989
- Tektronix, Inc.
- Arif Kareem
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
High Waveform Throughput with a Large Acquisition Memory
- Publication number 20110137594
- Publication date Jun 9, 2011
- Tektronix, Inc.
- Steven K. SULLIVAN
- G01 - MEASURING TESTING