St. Petersburg, FL, US
Information
Patent Grant
University of South Florida
David P Fries
G01 - MEASURING TESTING
Information
Patent Grant
University of South Florida
David P Fries
G01 - MEASURING TESTING
Information
Patent Grant
University of South Florida
Friso van Amerom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
University of South Florida
Matthew C. Smith
G01 - MEASURING TESTING
Information
Patent Grant
University of South Florida
Friso van Amerom
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
University of South Florida
David P. Fries
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
University of South Florida
Heather A. Broadbent
G01 - MEASURING TESTING
Information
Patent Application
University of South Florida
David P. Fries
G01 - MEASURING TESTING
Information
Patent Application
University of South Florida
David P. Fries
G01 - MEASURING TESTING
Information
Patent Application
University of South Florida
Matthew C. Smith
G01 - MEASURING TESTING
Information
Patent Application
Heather A. Broadbent
G01 - MEASURING TESTING
Information
Patent Application
UNIVERSITY OF SOUTH FLORIDA
David P. Fries
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
University of South Florida
Eric T Steimle
G01 - MEASURING TESTING
Information
Patent Application
David P. Fries
G01 - MEASURING TESTING
