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George Vandrish
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Vanier, CA
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last 30 patents
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Patent Grant
Sampling devices for detecting particulate contaminants
Patent number
4,464,574
Issue date
Aug 7, 1984
Pylon Electronic Development Co., Ltd.
George Vandrish
G01 - MEASURING TESTING
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Patent Grant
Laminated filters
Patent number
4,426,214
Issue date
Jan 17, 1984
Pylon Electronic Development Company Ltd.
George Vandrish
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL