Georgios TSIROGIANNIS

Person

Eindhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Method and system for determining overlay
- Patent number 11,774,869
- Issue date Oct 3, 2023
- ASML Netherlands B.V.
- Ruud Hendrikus Martinus Johannes Bloks
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for decision making in a semiconductor manufacturing process
- Patent number 11,687,007
- Issue date Jun 27, 2023
- ASML Netherlands B.V.
- Arnaud Hubaux
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimizing an apparatus for multi-stage processing of product units
- Patent number 11,520,238
- Issue date Dec 6, 2022
- ASML Netherlands B.V.
- Jelle Nije
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Optimizing an apparatus for multi-stage processing of product units
- Patent number 11,150,562
- Issue date Oct 19, 2021
- ASML Netherlands B.V.
- Jelle Nije
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Maintaining a set of process fingerprints
- Patent number 11,099,485
- Issue date Aug 24, 2021
- ASML Netherlands B.V.
- Alexander Ypma
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Generating predicted data for control or monitoring of a production...
- Patent number 11,099,486
- Issue date Aug 24, 2021
- ASML Netherlands B.V.
- Alexander Ypma
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE
- Publication number 20230341783
- Publication date Oct 26, 2023
- ASML NETHERLANDS B.V.
- Arnaud HUBAUX
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20230333482
- Publication date Oct 19, 2023
- ASML NETHERLANDS B.V.
- Arnaud HUBAUX
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD AND SYSTEM FOR DETERMINING OVERLAY
- Publication number 20220171299
- Publication date Jun 2, 2022
- ASML NETHERLANDS B.V.
- Ruud Hendrikus Martinus Johannes BLOKS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS
- Publication number 20220082949
- Publication date Mar 17, 2022
- ASML NETHERLANDS B.V.
- Arnaud HUBAUX
- G05 - CONTROLLING REGULATING
Information Patent Application
OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS
- Publication number 20220004108
- Publication date Jan 6, 2022
- ASML NETHERLANDS B.V.
- Jelle NIJE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MAINTAINING A SET OF PROCESS FINGERPRINTS
- Publication number 20210157247
- Publication date May 27, 2021
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS
- Publication number 20200233315
- Publication date Jul 23, 2020
- ASML NETHERLANDS B.V.
- Jelle NIJE
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
GENERATING PREDICTED DATA FOR CONTROL OR MONITORING OF A PRODUCTION...
- Publication number 20190369503
- Publication date Dec 5, 2019
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G05 - CONTROLLING REGULATING
Information Patent Application
APPARATUS AND METHOD FOR INFERRING PARAMETERS OF A MODEL OF A MEASU...
- Publication number 20180239851
- Publication date Aug 23, 2018
- ASML NETHERLANDS B.V.
- Alexander YPMA
- G06 - COMPUTING CALCULATING COUNTING

Georgios TSIROGIANNIS

Person

Patents Grantslast 30 patents

Method and system for determining overlay

Method for decision making in a semiconductor manufacturing process

Optimizing an apparatus for multi-stage processing of product units

Optimizing an apparatus for multi-stage processing of product units

Maintaining a set of process fingerprints

Generating predicted data for control or monitoring of a production...

Patents Applicationslast 30 patents

DETERMINING LITHOGRAPHIC MATCHING PERFORMANCE

METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS

A METHOD AND SYSTEM FOR DETERMINING OVERLAY

METHOD FOR DECISION MAKING IN A SEMICONDUCTOR MANUFACTURING PROCESS

OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS

MAINTAINING A SET OF PROCESS FINGERPRINTS

OPTIMIZING AN APPARATUS FOR MULTI-STAGE PROCESSING OF PRODUCT UNITS

GENERATING PREDICTED DATA FOR CONTROL OR MONITORING OF A PRODUCTION...

APPARATUS AND METHOD FOR INFERRING PARAMETERS OF A MODEL OF A MEASU...