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Gerald DICKER
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Taipei, NL
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Patents Grants
last 30 patents
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Patent Grant
Methods and apparatus for measuring a property of a substrate
Patent number
10,317,191
Issue date
Jun 11, 2019
ASML Netherlands B.V.
Wouter Lodewijk Elings
G05 - CONTROLLING REGULATING
Information
Patent Grant
Device manufacturing method, method of making a mask, and mask
Patent number
8,652,710
Issue date
Feb 18, 2014
ASML Netherlands B.V.
Gerald Dicker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Patents Applications
last 30 patents
Information
Patent Application
Methods and Apparatus for Measuring a Property of a Substrate
Publication number
20170160073
Publication date
Jun 8, 2017
ASML NETHERLANDS B.V.
Wouter Lodewijk ELINGS
G01 - MEASURING TESTING
Information
Patent Application
Methods and Apparatus for Measuring A Property of a Substrate
Publication number
20140354969
Publication date
Dec 4, 2014
ASML NETHERLANDS B.V.
Wouter Lodewijk Elings
G01 - MEASURING TESTING
Information
Patent Application
Device manufacturing method, method of making a mask, and mask
Publication number
20080292975
Publication date
Nov 27, 2008
ASML NETHERLANDS B.V.
Gerald Dicker
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY