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Gerald SCHOENECKER
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Munich, DE
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Patents Grants
last 30 patents
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Patent Grant
Electron beam device with dispersion compensation, and method of op...
Patent number
9,048,068
Issue date
Jun 2, 2015
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Stefan Lanio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Achromatic beam deflector, achromatic beam separator, charged parti...
Patent number
8,373,136
Issue date
Feb 12, 2013
ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH
Gerald Schoenecker
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High current density particle beam system
Patent number
7,335,894
Issue date
Feb 26, 2008
ICT Integrated Circuit Testing Gesselschaft
Juergen Frosien
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
SECONDARY ELECTRON OPTICS AND DETECTION DEVICE
Publication number
20140175277
Publication date
Jun 26, 2014
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik GmbH
Stefan Lanio
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON BEAM DEVICE WITH DISPERSION COMPENSATION, AND METHOD OF OP...
Publication number
20110272577
Publication date
Nov 10, 2011
ICT Integrated Circuit Testing Gesellschaft fuer Halbleiterprueftechnik GmbH
Stefan LANIO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ACHROMATIC BEAM DEFLECTOR, ACHROMATIC BEAM SEPARATOR, CHARGED PARTI...
Publication number
20110089322
Publication date
Apr 21, 2011
ICT Integrated Circuit Testing Gesellschaft fur Halbleiterpruftechnik mbH
Gerald SCHOENECKER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
High current density particle beam system
Publication number
20060151711
Publication date
Jul 13, 2006
Juergen Frosien
H01 - BASIC ELECTRIC ELEMENTS