Gerald Todd Seidler

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Seattle, WA, US

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Patents Grantslast 30 patents

Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,796,490
- Issue date Oct 24, 2023
- University of Washington
- Gerald Todd Seidler
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray spectrometer and methods for use
- Patent number 11,054,375
- Issue date Jul 6, 2021
- University of Washington
- Gerald Todd Seidler
- G02 - OPTICS
Information Patent Grant
Methods for aligning a spectrometer
- Patent number 10,962,490
- Issue date Mar 30, 2021
- University of Washington
- Devon R. Mortensen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Short working distance spectrometer and associated devices, systems...
- Patent number 8,537,967
- Issue date Sep 17, 2013
- University of Washington
- Gerald Todd Seidler
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20220003694
- Publication date Jan 6, 2022
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROMETER AND METHODS FOR USE
- Publication number 20190257774
- Publication date Aug 22, 2019
- University of Washington
- Gerald Todd SEIDLER
- G01 - MEASURING TESTING
Information Patent Application
Methods For Aligning A Spectrometer
- Publication number 20190011381
- Publication date Jan 10, 2019
- University of Washington
- Devon R. Mortensen
- G01 - MEASURING TESTING
Information Patent Application
X-Ray Spectrometer with Source Entrance Slit
- Publication number 20170184520
- Publication date Jun 29, 2017
- University of Washington
- Devon R. Mortensen
- G01 - MEASURING TESTING
Information Patent Application
SHORT WORKING DISTANCE SPECTROMETER AND ASSOCIATED DEVICES, SYSTEMS...
- Publication number 20110058652
- Publication date Mar 10, 2011
- University of Washington Center for Commercialization
- Gerald Todd Seidler
- G02 - OPTICS