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Gerald W. Back
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Tempe, AZ, US
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Patents Grants
last 30 patents
Information
Patent Grant
Modular space transformer for fine pitch vertical probing applications
Patent number
8,430,676
Issue date
Apr 30, 2013
SV Probe Pte. Ltd.
Son Dang
G01 - MEASURING TESTING
Information
Patent Grant
Probe head structure for probe test cards
Patent number
8,222,912
Issue date
Jul 17, 2012
SV Probe Pte. Ltd.
Son N. Dang
G01 - MEASURING TESTING
Information
Patent Grant
Cantilever probe card
Patent number
7,679,383
Issue date
Mar 16, 2010
SV Probe Pte. Ltd.
Lich Thanh Tran
G01 - MEASURING TESTING
Information
Patent Grant
Direct attachment of coaxial cables
Patent number
7,364,461
Issue date
Apr 29, 2008
SV Probe Pte. Ltd.
Gerald W. Back
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Method and apparatus for probe tip cleaning and shaping pad
Patent number
6,908,364
Issue date
Jun 21, 2005
Kulicke and Soffa Industries, Inc.
Gerald W. Back
B24 - GRINDING POLISHING
Information
Patent Grant
Alignment guide and signal transmission apparatus and method for sp...
Patent number
6,426,637
Issue date
Jul 30, 2002
Cerprobe Corporation
Son N. Dang
G01 - MEASURING TESTING
Information
Patent Grant
Inverted alignment station and method for calibrating needles of pr...
Patent number
6,002,426
Issue date
Dec 14, 1999
Cerprobe Corporation
Gerald W. Back
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Modular Space Transformer For Fine Pitch Vertical Probing Applications
Publication number
20110032063
Publication date
Feb 10, 2011
Son Dang
G01 - MEASURING TESTING
Information
Patent Application
Probe Head Structure For Probe Test Cards
Publication number
20100231249
Publication date
Sep 16, 2010
Son N. Dang
G01 - MEASURING TESTING
Information
Patent Application
Probe Test Card with Flexible Interconnect Structure
Publication number
20100176831
Publication date
Jul 15, 2010
William M. Palcisko
G01 - MEASURING TESTING
Information
Patent Application
Bond Reinforcement Layer for Probe Test Cards
Publication number
20090174423
Publication date
Jul 9, 2009
Peter J. Klaerner
G01 - MEASURING TESTING
Information
Patent Application
Cantilever probe card
Publication number
20080204062
Publication date
Aug 28, 2008
Lich Thanh Tran
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for probe tip cleaning and shaping pad
Publication number
20030027496
Publication date
Feb 6, 2003
Gerald W. Back
B24 - GRINDING POLISHING