Gerard H. Vurens

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Santa Clara County, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for detecting scratches on non-semiconductor wa...
- Patent number 7,649,624
- Issue date Jan 19, 2010
- Crystal Technology, Inc.
- Yun-Biao Xin
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance surface analyzer
- Patent number 7,206,066
- Issue date Apr 17, 2007
- KLA-Tencor Technologies Corporation
- Gerard H. Vurens
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for surface analysis
- Patent number 6,678,043
- Issue date Jan 13, 2004
- Gerard H. Vurens
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system using polarized light
- Patent number 6,515,745
- Issue date Feb 4, 2003
- HDI Instrumentation
- Gerard H. Vurens
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system using polarized light
- Patent number 6,307,627
- Issue date Oct 23, 2001
- HDI Instrumentation
- Gerard H. Vurens
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement system using polarized light
- Patent number 6,134,011
- Issue date Oct 17, 2000
- HDI Instrumentation
- David L. Klein
- G01 - MEASURING TESTING
Information Patent Grant
Thin film optical measurement system
- Patent number 5,898,181
- Issue date Apr 27, 1999
- HDI Instrumentation
- Gerard H. Vurens
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR DETECTING SCRATCHES ON NON-SEMICONDUCTOR WA...
- Publication number 20100014074
- Publication date Jan 21, 2010
- Yun-Biao Xin
- G01 - MEASURING TESTING
Information Patent Application
Reflectance surface analyzer
- Publication number 20050206884
- Publication date Sep 22, 2005
- HDI INSTRUMENTATION
- Kasra Khazeni
- G01 - MEASURING TESTING
Information Patent Application
Optical measurment system using polarized light
- Publication number 20020054290
- Publication date May 9, 2002
- Gerard H. Vurens
- G01 - MEASURING TESTING