Gerard M. Salem

Person

Essex Junction, VT, US

People

Patents Grantslast 30 patents

Information Patent Grant
Diagnostic enhancement for multiple instances of identical structures
- Patent number 11,378,623
- Issue date Jul 5, 2022
- International Business Machines Corporation
- Steven Michael Douskey
- G11 - INFORMATION STORAGE
Information Patent Grant
Iterative functional test exerciser reload and execution
- Patent number 10,930,364
- Issue date Feb 23, 2021
- International Business Machines Corporation
- Franco Motika
- G11 - INFORMATION STORAGE
Information Patent Grant
Non-destructive recirculation test support for integrated circuits
- Patent number 10,613,142
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing test and calibration of integrat...
- Patent number 10,598,526
- Issue date Mar 24, 2020
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Functional diagnostics based on dynamic selection of alternate cloc...
- Patent number 10,585,142
- Issue date Mar 10, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Performing system functional test on a chip having partial-good por...
- Patent number 10,571,519
- Issue date Feb 25, 2020
- International Business Machines Corporation
- Mitesh A. Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Functional diagnostics based on dynamic selection of alternate cloc...
- Patent number 10,545,188
- Issue date Jan 28, 2020
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for performing test and calibration of integrat...
- Patent number 10,365,132
- Issue date Jul 30, 2019
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Grant
Structurally assisted functional test and diagnostics for integrate...
- Patent number 10,247,776
- Issue date Apr 2, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating functional test patterns for man...
- Patent number 10,209,306
- Issue date Feb 19, 2019
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating functional test patterns for man...
- Patent number 10,203,371
- Issue date Feb 12, 2019
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating functional test patterns for man...
- Patent number 9,857,422
- Issue date Jan 2, 2018
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Grant
Optimized chain diagnostic fail isolation
- Patent number 9,733,307
- Issue date Aug 15, 2017
- International Business Machines Corporation
- Gerard M. Salem
- G01 - MEASURING TESTING
Information Patent Grant
Core diagnostics and repair
- Patent number 8,984,335
- Issue date Mar 17, 2015
- International Business Machines Corporation
- Sreekala Anandavally
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-core diagnostics and repair using firmware and spare cores
- Patent number 8,977,895
- Issue date Mar 10, 2015
- International Business Machines Corporation
- Sreekala Anandavally
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Clock-based debugging for embedded dynamic random access memory ele...
- Patent number 8,495,287
- Issue date Jul 23, 2013
- International Business Machines Corporation
- Adam B. Collura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Support element office mode array repair code verification
- Patent number 8,438,431
- Issue date May 7, 2013
- International Business Machines Corporation
- Edward C. McCain
- G11 - INFORMATION STORAGE
Information Patent Grant
Radio frequency-enabled electromigration fuse
- Patent number 8,169,321
- Issue date May 1, 2012
- International Business Machines Corporation
- Subramanian S. Iyer
- G01 - MEASURING TESTING
Information Patent Grant
Testing of ECC memories
- Patent number 7,308,621
- Issue date Dec 11, 2007
- International Business Machines Corporation
- R. Dean Adams
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and system for performing static timing analysis on digital...
- Patent number 7,194,715
- Issue date Mar 20, 2007
- International Business Machines Corporation
- Steven E. Charlebois
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optimized ECC/redundancy fault recovery
- Patent number 7,149,941
- Issue date Dec 12, 2006
- International Business Machines Corporation
- R. Dean Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and circuit for dynamic read margin control of a memory array
- Patent number 7,042,776
- Issue date May 9, 2006
- International Business Machines Corporation
- Miles G. Canada
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method for synchronizing divide-by counters
- Patent number 6,989,696
- Issue date Jan 24, 2006
- International Business Machines Corporation
- Rolf Hilgendorf
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of...
- Patent number 6,643,807
- Issue date Nov 4, 2003
- International Business Machines Corporation
- Jay G. Heaslip
- G11 - INFORMATION STORAGE
Information Patent Grant
Method for testing adapter card ASIC using reconfigurable logic
- Patent number 5,844,917
- Issue date Dec 1, 1998
- International Business Machines Corporation
- Gerard M. Salem
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for testing an adapter card ASIC with reconfigurable logic
- Patent number 5,841,790
- Issue date Nov 24, 1998
- International Business Machines Corporation
- Gerard M. Salem
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for independently transferring data using two independently...
- Patent number 5,664,223
- Issue date Sep 2, 1997
- International Business Machines Corporation
- Carl A. Bender
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of I/O pin assignment in a hierarchial packaging system
- Patent number 5,544,088
- Issue date Aug 6, 1996
- International Business Machines Corporation
- Matthew E. Aubertine
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES
- Publication number 20220178996
- Publication date Jun 9, 2022
- International Business Machines Corporation
- Steven Michael DOUSKEY
- G11 - INFORMATION STORAGE
Information Patent Application
ITERATIVE FUNCTIONAL TEST EXERCISER RELOAD AND EXECUTION
- Publication number 20200160932
- Publication date May 21, 2020
- International Business Machines Corporation
- Franco Motika
- G11 - INFORMATION STORAGE
Information Patent Application
FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...
- Publication number 20190094297
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...
- Publication number 20190094298
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...
- Publication number 20180306610
- Publication date Oct 25, 2018
- International Business Machines Corporation
- Mitesh Agrawal
- G01 - MEASURING TESTING
Information Patent Application
NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS
- Publication number 20180238964
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATE...
- Publication number 20180238962
- Publication date Aug 23, 2018
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...
- Publication number 20180067162
- Publication date Mar 8, 2018
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
PERFORMING SYSTEM FUNCTIONAL TEST ON A CHIP HAVING PARTIAL-GOOD POR...
- Publication number 20170261551
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Mitesh A. Agrawal
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...
- Publication number 20170261552
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...
- Publication number 20170261554
- Publication date Sep 14, 2017
- International Business Machines Corporation
- Franco Motika
- G01 - MEASURING TESTING
Information Patent Application
CORE DIAGNOSTICS AND REPAIR
- Publication number 20140108859
- Publication date Apr 17, 2014
- International Business Machines Corporation
- Sreekala Anandavally
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CORE DIAGNOSTICS AND REPAIR
- Publication number 20140025991
- Publication date Jan 23, 2014
- International Business Machines Corporation
- Sreekala Anandavally
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LOADING AND UNLOADING A MEMORY ELEMENT FOR DEBUG
- Publication number 20110320716
- Publication date Dec 29, 2011
- International Business Machines Corporation
- Adam B. Collura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADIO FREQUENCY-ENABLED ELECTROMIGRATION FUSE
- Publication number 20110187407
- Publication date Aug 4, 2011
- International Business Machines Corporation
- Subramanian S. Iyer
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SUPPORT ELEMENT OFFICE MODE ARRAY REPAIR CODE VERIFICATION
- Publication number 20110113295
- Publication date May 12, 2011
- International Business Machines Corporation
- Edward C. McCain
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method of Multi-Frequency Integrated Circuit Testing
- Publication number 20080282123
- Publication date Nov 13, 2008
- Charles L. Meissner
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR PERFORMING STATIC TIMING ANALYSIS ON DIGITAL...
- Publication number 20050246673
- Publication date Nov 3, 2005
- International Business Machines Corporation
- Steven E. Charlebois
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND CIRCUIT FOR DYNAMIC READ MARGIN CONTROL OF A MEMORY ARRAY
- Publication number 20050180228
- Publication date Aug 18, 2005
- International Business Machines Corporation
- Miles G. Canada
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEM AND METHOD FOR SYNCHRONIZING DIVIDE-BY COUNTERS
- Publication number 20050104637
- Publication date May 19, 2005
- International Business Machines Corporation
- Rolf Hilgendorf
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
Method and apparatus for providing accurate junction temperature in...
- Publication number 20040066837
- Publication date Apr 8, 2004
- Joshua W. Armour
- G01 - MEASURING TESTING
Information Patent Application
Optimized ECC/redundancy fault recovery
- Publication number 20030204798
- Publication date Oct 30, 2003
- International Business Machines Corporation
- R. Dean Adams
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Testing of ECC memories
- Publication number 20030204795
- Publication date Oct 30, 2003
- International Business Machines Corporation
- R. Dean Adams
- G11 - INFORMATION STORAGE

Gerard M. Salem

Person

Patents Grantslast 30 patents

Diagnostic enhancement for multiple instances of identical structures

Iterative functional test exerciser reload and execution

Non-destructive recirculation test support for integrated circuits

Methods and systems for performing test and calibration of integrat...

Functional diagnostics based on dynamic selection of alternate cloc...

Performing system functional test on a chip having partial-good por...

Functional diagnostics based on dynamic selection of alternate cloc...

Methods and systems for performing test and calibration of integrat...

Structurally assisted functional test and diagnostics for integrate...

Methods and systems for generating functional test patterns for man...

Methods and systems for generating functional test patterns for man...

Methods and systems for generating functional test patterns for man...

Optimized chain diagnostic fail isolation

Core diagnostics and repair

Multi-core diagnostics and repair using firmware and spare cores

Clock-based debugging for embedded dynamic random access memory ele...

Support element office mode array repair code verification

Radio frequency-enabled electromigration fuse

Testing of ECC memories

Method and system for performing static timing analysis on digital...

Optimized ECC/redundancy fault recovery

Method and circuit for dynamic read margin control of a memory array

System and method for synchronizing divide-by counters

Array-built-in-self-test (ABIST) for efficient, fast, bitmapping of...

Method for testing adapter card ASIC using reconfigurable logic

Apparatus for testing an adapter card ASIC with reconfigurable logic

System for independently transferring data using two independently...

Method of I/O pin assignment in a hierarchial packaging system

Patents Applicationslast 30 patents

DIAGNOSTIC ENHANCEMENT FOR MULTIPLE INSTANCES OF IDENTICAL STRUCTURES

ITERATIVE FUNCTIONAL TEST EXERCISER RELOAD AND EXECUTION

FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...

FUNCTIONAL DIAGNOSTICS BASED ON DYNAMIC SELECTION OF ALTERNATE CLOC...

METHODS AND SYSTEMS FOR PERFORMING TEST AND CALIBRATION OF INTEGRAT...

NON-DESTRUCTIVE RECIRCULATION TEST SUPPORT FOR INTEGRATED CIRCUITS

STRUCTURALLY ASSISTED FUNCTIONAL TEST AND DIAGNOSTICS FOR INTEGRATE...

METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...

PERFORMING SYSTEM FUNCTIONAL TEST ON A CHIP HAVING PARTIAL-GOOD POR...

METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...

METHODS AND SYSTEMS FOR GENERATING FUNCTIONAL TEST PATTERNS FOR MAN...

CORE DIAGNOSTICS AND REPAIR

CORE DIAGNOSTICS AND REPAIR

LOADING AND UNLOADING A MEMORY ELEMENT FOR DEBUG

RADIO FREQUENCY-ENABLED ELECTROMIGRATION FUSE

SUPPORT ELEMENT OFFICE MODE ARRAY REPAIR CODE VERIFICATION

System and Method of Multi-Frequency Integrated Circuit Testing

METHOD AND SYSTEM FOR PERFORMING STATIC TIMING ANALYSIS ON DIGITAL...

METHOD AND CIRCUIT FOR DYNAMIC READ MARGIN CONTROL OF A MEMORY ARRAY

SYSTEM AND METHOD FOR SYNCHRONIZING DIVIDE-BY COUNTERS

Method and apparatus for providing accurate junction temperature in...

Optimized ECC/redundancy fault recovery

Testing of ECC memories