Gerard Nicolaas Anne van Veen

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Waalre, NL

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Patents Grantslast 30 patents

Information Patent Grant
Stage assembly, particle-optical apparatus comprising such a stage...
- Patent number 7,474,419
- Issue date Jan 6, 2009
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING
Information Patent Grant
Method for the manufacture and transmissive irradiation of a sample...
- Patent number 6,963,068
- Issue date Nov 8, 2005
- FEI Company
- Peter Emile Stephan Joseph Asselbergs
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Radiation Detector
- Publication number 20110169116
- Publication date Jul 14, 2011
- FEI Company
- Lis Karen Nanver
- H01 - BASIC ELECTRIC ELEMENTS