Gerard Nicolaas Anne van Veen

Person

Waalre, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Stroboscopic illumination synchronized electron detection and imaging
- Patent number 12,165,835
- Issue date Dec 10, 2024
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-gated detection, dual-layer SPAD-based electron detection
- Patent number 11,551,906
- Issue date Jan 10, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-electron-beam imaging apparatus with improved performance
- Patent number 10,971,326
- Issue date Apr 6, 2021
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
EELS detection technique in an electron microscope
- Patent number 10,832,901
- Issue date Nov 10, 2020
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Innovative source assembly for ion beam production
- Patent number 10,651,005
- Issue date May 12, 2020
- FEI Company
- Leon van Kouwen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-beam scanning transmission charged particle microscope
- Patent number 10,607,811
- Issue date Mar 31, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Emission noise correction of a charged particle source
- Patent number 10,453,647
- Issue date Oct 22, 2019
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Innovative source assembly for ion beam production
- Patent number 9,941,094
- Issue date Apr 10, 2018
- FEI Company
- Leon van Kouwen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle microscope with improved spectroscopic functionality
- Patent number 9,812,287
- Issue date Nov 7, 2017
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of performing spectroscopy in a transmission charged-particl...
- Patent number 9,778,377
- Issue date Oct 3, 2017
- FEI Company
- Luigi Mele
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Micro-chamber for inspecting sample material
- Patent number 9,741,529
- Issue date Aug 22, 2017
- FEI Company
- Luigi Mele
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mathematical image assembly in a scanning-type microscope
- Patent number 9,620,330
- Issue date Apr 11, 2017
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Grant
Micro-reactor for observing particles in a fluid
- Patent number 9,162,211
- Issue date Oct 20, 2015
- FEI Company
- Gerard Anne Nicolaas Van Veen
- G01 - MEASURING TESTING
Information Patent Grant
Silicon drift diode detector configured to switch between pulse hei...
- Patent number 8,941,072
- Issue date Jan 27, 2015
- FEI Company
- Cornelis Sander Kooijman
- G01 - MEASURING TESTING
Information Patent Grant
Radiation detector
- Patent number 8,450,820
- Issue date May 28, 2013
- Lis Karen Nanver
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Laser Thermal Epitaxy in a Charged Particle Microscope
- Publication number 20240161999
- Publication date May 16, 2024
- FEI Company
- Rudolf Geurink
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-GATED DETECTION, DUAL-LAYER SPAD-BASED ELECTRON DETECTION
- Publication number 20230005705
- Publication date Jan 5, 2023
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STROBOSCOPIC ILLUMINATION SYNCHRONIZED ELECTRON DETECTION AND IMAGING
- Publication number 20220208510
- Publication date Jun 30, 2022
- FEI Company
- Bart Jozef Janssen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE
- Publication number 20200090899
- Publication date Mar 19, 2020
- FEI Company
- Ali Mohammadi-Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE
- Publication number 20190341243
- Publication date Nov 7, 2019
- FEI Company
- Bert Henning Freitag
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE
- Publication number 20180233322
- Publication date Aug 16, 2018
- FEI Company
- Ali Mohammadi Gheidari
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INNOVATIVE SOURCE ASSEMBLY FOR ION BEAM PRODUCTION
- Publication number 20180218875
- Publication date Aug 2, 2018
- FEI Company
- Leon van Kouwen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL
- Publication number 20170032928
- Publication date Feb 2, 2017
- FEI Company
- Luigi Mele
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICL...
- Publication number 20160276130
- Publication date Sep 22, 2016
- FEI Company
- Luigi Mele
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY
- Publication number 20160189922
- Publication date Jun 30, 2016
- FEI Company
- Cornelis Sander Kooijman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Radiation Sensor, and its Application in a Charged-Particle Microscope
- Publication number 20160056015
- Publication date Feb 25, 2016
- FEI Company
- Gerard Nicolaas Anne van Veen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE
- Publication number 20150371815
- Publication date Dec 24, 2015
- FEI Company
- Pavel Potocek
- G02 - OPTICS
Information Patent Application
Stage assembly, particle-optical apparatus comprising such a stage...
- Publication number 20070125958
- Publication date Jun 7, 2007
- FEI Company
- Hendrik Gezinus Tappel
- G01 - MEASURING TESTING

Gerard Nicolaas Anne van Veen

Person

Patents Grantslast 30 patents

Stroboscopic illumination synchronized electron detection and imaging

Time-gated detection, dual-layer SPAD-based electron detection

Multi-electron-beam imaging apparatus with improved performance

EELS detection technique in an electron microscope

Innovative source assembly for ion beam production

Multi-beam scanning transmission charged particle microscope

Emission noise correction of a charged particle source

Innovative source assembly for ion beam production

Charged particle microscope with improved spectroscopic functionality

Method of performing spectroscopy in a transmission charged-particl...

Micro-chamber for inspecting sample material

Mathematical image assembly in a scanning-type microscope

Micro-reactor for observing particles in a fluid

Silicon drift diode detector configured to switch between pulse hei...

Radiation detector

Patents Applicationslast 30 patents

Laser Thermal Epitaxy in a Charged Particle Microscope

TIME-GATED DETECTION, DUAL-LAYER SPAD-BASED ELECTRON DETECTION

STROBOSCOPIC ILLUMINATION SYNCHRONIZED ELECTRON DETECTION AND IMAGING

MULTI-ELECTRON-BEAM IMAGING APPARATUS WITH IMPROVED PERFORMANCE

EELS DETECTION TECHNIQUE IN AN ELECTRON MICROSCOPE

EMISSION NOISE CORRECTION OF A CHARGED PARTICLE SOURCE

INNOVATIVE SOURCE ASSEMBLY FOR ION BEAM PRODUCTION

MICRO-CHAMBER FOR INSPECTING SAMPLE MATERIAL

METHOD OF PERFORMING SPECTROSCOPY IN A TRANSMISSION CHARGED-PARTICL...

CHARGED PARTICLE MICROSCOPE WITH IMPROVED SPECTROSCOPIC FUNCTIONALITY

Radiation Sensor, and its Application in a Charged-Particle Microscope

MATHEMATICAL IMAGE ASSEMBLY IN A SCANNING-TYPE MICROSCOPE

Stage assembly, particle-optical apparatus comprising such a stage...