Gerard VAN DEN EIJKEL

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Enschede, NL

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Patents Grantslast 30 patents

Information Patent Grant
Sensor system, substrate handling system and lithographic apparatus
- Patent number 10,007,197
- Issue date Jun 26, 2018
- ASML Netherlands B.V.
- Joeri Lof
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
MEASURING DEVICE AND METHOD FOR MEASURING OPTICAL ELEMENTS
- Publication number 20240159513
- Publication date May 16, 2024
- DUTCH UNITED INSTRUMENTS B.V.
- Rens HENSELMANS
- G01 - MEASURING TESTING
Information Patent Application
SENSOR SYSTEM, SUBSTRATE HANDLING SYSTEM AND LITHOGRAPHIC APPARATUS
- Publication number 20160370716
- Publication date Dec 22, 2016
- ASML NETHERLANDS B.V.
- Joeri LOF
- G01 - MEASURING TESTING