Gerardo A. Brucker

Person

Longmont, CO, US

People

Patents Grantslast 30 patents

Information Patent Grant
Thermal conductivity gauge
- Patent number 12,181,366
- Issue date Dec 31, 2024
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Pirani gauge with model of power dissipation
- Patent number 12,123,794
- Issue date Oct 22, 2024
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Load-lock gauge
- Patent number 12,055,452
- Issue date Aug 6, 2024
- MKS Instruments, Inc.
- Gerardo A. Brucker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Thermal conductivity gauge
- Patent number 11,946,823
- Issue date Apr 2, 2024
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Thermal conductivity pressure gauge with heated chamber wall
- Patent number 11,808,643
- Issue date Nov 7, 2023
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Load-lock gauge
- Patent number 11,802,806
- Issue date Oct 31, 2023
- MKS Instruments, Inc.
- Gerardo A. Brucker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Thermal conductivity gauge
- Patent number 11,656,139
- Issue date May 23, 2023
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Polymer composite vacuum components
- Patent number 11,366,036
- Issue date Jun 21, 2022
- MKS Instruments, Inc.
- Brandon J. Kelly
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Anode electrode shield for inverted magnetron cold cathode ionizati...
- Patent number 10,969,290
- Issue date Apr 6, 2021
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Gas analyzer system with ion source
- Patent number 10,948,456
- Issue date Mar 16, 2021
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Gas analysis with an inverted magnetron source
- Patent number 10,928,265
- Issue date Feb 23, 2021
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for partial pressure detection
- Patent number 10,914,717
- Issue date Feb 9, 2021
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Polymer composite vacuum components
- Patent number 10,876,917
- Issue date Dec 29, 2020
- MKS Instruments, Inc.
- Brandon J. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Thermal conductivity gauge
- Patent number 10,845,263
- Issue date Nov 24, 2020
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Polymer composite vacuum components
- Patent number 10,359,332
- Issue date Jul 23, 2019
- MKS Instruments, Inc.
- Brandon J. Kelly
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Cold cathode ionization vacuum gauge
- Patent number 10,352,811
- Issue date Jul 16, 2019
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Devices and methods for feedthrough leakage current detection and d...
- Patent number 10,132,707
- Issue date Nov 20, 2018
- MKS Instruments, Inc.
- Stephen C. Blouch
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,952,113
- Issue date Apr 24, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode ionization vacuum gauge
- Patent number 9,797,797
- Issue date Oct 24, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Trace gas concentration in ART MS traps
- Patent number 9,714,919
- Issue date Jul 25, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cold cathode ionization vacuum gauge
- Patent number 9,671,302
- Issue date Jun 6, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,593,996
- Issue date Mar 14, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Long lifetime cold cathode ionization vacuum gauge design
- Patent number 9,588,004
- Issue date Mar 7, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 9,404,827
- Issue date Aug 2, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 9,383,286
- Issue date Jul 5, 2016
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum quality measurement system
- Patent number 9,322,738
- Issue date Apr 26, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for tuning an electrostatic ion trap
- Patent number 9,040,907
- Issue date May 26, 2015
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 8,947,098
- Issue date Feb 3, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge having electron multiplier cold emission source
- Patent number 8,686,733
- Issue date Apr 1, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 8,648,604
- Issue date Feb 11, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Thermal Conductivity Gauge
- Publication number 20240201035
- Publication date Jun 20, 2024
- MKS Instrument, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Pirani Gauge
- Publication number 20240118158
- Publication date Apr 11, 2024
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Load-Lock Gauge
- Publication number 20240019332
- Publication date Jan 18, 2024
- MKS Instruments, Inc.
- Gerardo A. Brucker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Thermal Conductivity Gauge
- Publication number 20230366763
- Publication date Nov 16, 2023
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Binary Gas Purity Analyzer
- Publication number 20230127693
- Publication date Apr 27, 2023
- MKS Instruments, Inc.
- Chad David Wilson
- G01 - MEASURING TESTING
Information Patent Application
Load-Lock Gauge
- Publication number 20220228939
- Publication date Jul 21, 2022
- MKS Instruments, Inc.
- Gerardo A. Brucker
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Thermal Conductivity Gauge
- Publication number 20220155172
- Publication date May 19, 2022
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Thermal Conductivity Gauge
- Publication number 20210208016
- Publication date Jul 8, 2021
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Polymer Composite Vacuum Components
- Publication number 20210096035
- Publication date Apr 1, 2021
- Brandon J. Kelly
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Gas Analysis with an Inverted Magnetron Source
- Publication number 20190368959
- Publication date Dec 5, 2019
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Partial Pressure Detection
- Publication number 20190346328
- Publication date Nov 14, 2019
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Thermal Conductivity Gauge
- Publication number 20190316981
- Publication date Oct 17, 2019
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Polymer Composite Vacuum Components
- Publication number 20190271607
- Publication date Sep 5, 2019
- Brandon J. Kelly
- G01 - MEASURING TESTING
Information Patent Application
END POINT DETECTION FOR LYOPHILIZATION
- Publication number 20180306763
- Publication date Oct 25, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
ANODE ELECTRODE SHIELD FOR INVERTED MAGNETRON COLD CATHODE IONIZATI...
- Publication number 20180164176
- Publication date Jun 14, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
COLD CATHODE IONIZATION VACUUM GAUGE
- Publication number 20180010977
- Publication date Jan 11, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION GAUGE FOR HIGH PRESSURE OPERATION
- Publication number 20170146420
- Publication date May 25, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Devices And Methods For Feedthrough Leakage Current Detection And D...
- Publication number 20170010171
- Publication date Jan 12, 2017
- MKS Instruments, Inc.
- Stephen C. Blouch
- G01 - MEASURING TESTING
Information Patent Application
Polymer Composite Vacuum Components
- Publication number 20160209288
- Publication date Jul 21, 2016
- MKS Instruments, Inc.
- Brandon J. Kelly
- G01 - MEASURING TESTING
Information Patent Application
LONG LIFETIME COLD CATHODE IONIZATION VACUUM GAUGE DESIGN
- Publication number 20160131548
- Publication date May 12, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION GAUGE FOR HIGH PRESSURE OPERATION
- Publication number 20150300904
- Publication date Oct 22, 2015
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Emission Current and Bias Potential Control
- Publication number 20150108993
- Publication date Apr 23, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Application
COLD CATHODE IONIZATION VACUUM GAUGE
- Publication number 20150091580
- Publication date Apr 2, 2015
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
COLD CATHODE IONIZATION VACUUM GAUGE
- Publication number 20150091579
- Publication date Apr 2, 2015
- MKS Instruments, Inc,
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Trace Gas Concentration in ART MS Traps
- Publication number 20150028882
- Publication date Jan 29, 2015
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR TUNING AN ELECTROSTATIC ION TRAP
- Publication number 20140264068
- Publication date Sep 18, 2014
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...
- Publication number 20140152320
- Publication date Jun 5, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Vacuum Quality Measurement System
- Publication number 20120227465
- Publication date Sep 13, 2012
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Ion Trap
- Publication number 20120112056
- Publication date May 10, 2012
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ionization Gauge Having Electron Multiplier Cold Emission Source
- Publication number 20110234233
- Publication date Sep 29, 2011
- Gerardo A. Brucker
- G01 - MEASURING TESTING

Gerardo A. Brucker

Person

Patents Grantslast 30 patents

Thermal conductivity gauge

Pirani gauge with model of power dissipation

Load-lock gauge

Thermal conductivity gauge

Thermal conductivity pressure gauge with heated chamber wall

Load-lock gauge

Thermal conductivity gauge

Polymer composite vacuum components

Anode electrode shield for inverted magnetron cold cathode ionizati...

Gas analyzer system with ion source

Gas analysis with an inverted magnetron source

Method and apparatus for partial pressure detection

Polymer composite vacuum components

Thermal conductivity gauge

Polymer composite vacuum components

Cold cathode ionization vacuum gauge

Devices and methods for feedthrough leakage current detection and d...

Ionization gauge for high pressure operation

Cold cathode ionization vacuum gauge

Trace gas concentration in ART MS traps

Cold cathode ionization vacuum gauge

Ionization gauge for high pressure operation

Long lifetime cold cathode ionization vacuum gauge design

Ionization gauge with operational parameters and geometry designed...

Ionization gauge with emission current and bias potential control

Vacuum quality measurement system

Method and apparatus for tuning an electrostatic ion trap

Ionization gauge with emission current and bias potential control

Ionization gauge having electron multiplier cold emission source

Ionization gauge with operational parameters and geometry designed...

Patents Applicationslast 30 patents

Thermal Conductivity Gauge

Pirani Gauge

Load-Lock Gauge

Thermal Conductivity Gauge

Binary Gas Purity Analyzer

Load-Lock Gauge

Thermal Conductivity Gauge

Thermal Conductivity Gauge

Polymer Composite Vacuum Components

Gas Analysis with an Inverted Magnetron Source

Method and Apparatus for Partial Pressure Detection

Thermal Conductivity Gauge

Polymer Composite Vacuum Components

END POINT DETECTION FOR LYOPHILIZATION

ANODE ELECTRODE SHIELD FOR INVERTED MAGNETRON COLD CATHODE IONIZATI...

COLD CATHODE IONIZATION VACUUM GAUGE

IONIZATION GAUGE FOR HIGH PRESSURE OPERATION

Devices And Methods For Feedthrough Leakage Current Detection And D...

Polymer Composite Vacuum Components

LONG LIFETIME COLD CATHODE IONIZATION VACUUM GAUGE DESIGN

IONIZATION GAUGE FOR HIGH PRESSURE OPERATION

Ionization Gauge With Emission Current and Bias Potential Control

COLD CATHODE IONIZATION VACUUM GAUGE

COLD CATHODE IONIZATION VACUUM GAUGE

Trace Gas Concentration in ART MS Traps

METHOD AND APPARATUS FOR TUNING AN ELECTROSTATIC ION TRAP

IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...

Vacuum Quality Measurement System

Electrostatic Ion Trap

Ionization Gauge Having Electron Multiplier Cold Emission Source