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GERARDUS GERNARDUS JOZEF MULDER
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EINDHOVEN, NL
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Patents Grants
last 30 patents
Information
Patent Grant
Cryogenic cooling system with temperature-dependent thermal shunt
Patent number
11,274,857
Issue date
Mar 15, 2022
Koninklijke Philips N.V.
Thomas Erik Amthor
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Cooling a gradient coil of a magnetic resonance imaging system
Patent number
11,137,460
Issue date
Oct 5, 2021
Koninklijke Philips N.V.
Gerardus Bernardus Jozef Mulder
G01 - MEASURING TESTING
Information
Patent Grant
Cryogenic field sensing for compensating magnetic field variations...
Patent number
10,761,163
Issue date
Sep 1, 2020
Koninklijke Philips N.V.
Gerardus Bernardus Jozef Mulder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for automatically ramping down a superconducting...
Patent number
10,411,460
Issue date
Sep 10, 2019
Koninklijke Philips N.V.
Philip Alexander Jonas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Superconducting coil support device and method and apparatus includ...
Patent number
10,365,338
Issue date
Jul 30, 2019
Koninklijke Philips N.V.
Philip Alexander Jonas
G01 - MEASURING TESTING
Information
Patent Grant
Superconducting magnet with cryogenic thermal buffer
Patent number
10,256,021
Issue date
Apr 9, 2019
Koninklijke Philips N.V.
Gerardus Bernardus Jozef Mulder
G01 - MEASURING TESTING
Information
Patent Grant
Air ventilation system with radio frequency shielding for use in ma...
Patent number
10,145,911
Issue date
Dec 4, 2018
Koninklijke Philips N.V.
Gerardus Gernardus Jozef Mulder
G01 - MEASURING TESTING
Information
Patent Grant
System and method for automatically ramping down a superconducting...
Patent number
9,985,426
Issue date
May 29, 2018
Koninklijke Philips N.V.
Philip Alexander Jonas
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Magnetic resonance imaging system with satellite gradient coils
Patent number
9,435,869
Issue date
Sep 6, 2016
Koninklijke Philips N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Grant
RF shield for MRI comprising conductive coating as shielding material
Patent number
9,417,301
Issue date
Aug 16, 2016
Koninklijke Philips N.V.
Cornelis Leonardus Gerardus Ham
G01 - MEASURING TESTING
Information
Patent Grant
Tesseral shim coil for a magnetic resonance system
Patent number
9,081,070
Issue date
Jul 14, 2015
Koninklijke Philips N.V.
Jan Konijn
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance system with cooling system and monitoring of hel...
Patent number
8,593,145
Issue date
Nov 26, 2013
Koninklijke Philips N.V.
Johannes Ferdinand Van Der Koijk
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging scanner with molded fixed shims
Patent number
7,495,441
Issue date
Feb 24, 2009
Koninklijke Philips Electronics N.V.
William H. Amor
G01 - MEASURING TESTING
Information
Patent Grant
Shielded treatment room and device suitable for recording images on...
Patent number
7,304,476
Issue date
Dec 4, 2007
Koninklijke Philips Electronics N.V.
Marinus L. A. Vrinten
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for aligning a magnetic field modifying struct...
Patent number
6,836,119
Issue date
Dec 28, 2004
Koninklijke Philips Electronics, N.V.
Gordon D. DeMeester
G01 - MEASURING TESTING
Information
Patent Grant
Method of and device for the compensation of variations of the main...
Patent number
6,731,113
Issue date
May 4, 2004
Koninklijke Philips Electronics N.V.
Cornelis L.G. Ham
G01 - MEASURING TESTING
Information
Patent Grant
MRI apparatus with gradient control conversion unit
Patent number
6,541,972
Issue date
Apr 1, 2003
Koninklijke Philips Electronics N.V.
Gerardus Bernardus Jozef Mulder
G01 - MEASURING TESTING
Information
Patent Grant
MRI apparatus with a mechanically integrated eddy current shield in...
Patent number
6,326,788
Issue date
Dec 4, 2001
U.S. Philips Corporation
Gerardus B. J. Mulder
G01 - MEASURING TESTING
Information
Patent Grant
MRI apparatus having a short uniform field magnet with an internal...
Patent number
6,255,822
Issue date
Jul 3, 2001
U.S. Philips Corporation
Gerardus B. J. Mulder
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance imaging apparatus including a graident coil syst...
Patent number
6,236,208
Issue date
May 22, 2001
U.S. Philips Corporation
Cornelis L. G. Ham
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance apparatus
Patent number
6,107,800
Issue date
Aug 22, 2000
U.S. Philips Corporation
Tatjana Claasen-Vujcic
G01 - MEASURING TESTING
Information
Patent Grant
Magnetic resonance apparatus comprising a superconducting magnet
Patent number
5,426,366
Issue date
Jun 20, 1995
U.S. Philips Corporation
Johannes A. Overweg
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
COOLING A GRADIENT COIL OF A MAGNETIC RESONANCE IMAGING SYSTEM
Publication number
20200072923
Publication date
Mar 5, 2020
Koninklijke Philips N.V.
GERARDUS BERNARDUS JOZEF MULDER
G01 - MEASURING TESTING
Information
Patent Application
CRYOGENIC FIELD SENSING FOR COMPENSATING MAGNETIC FIELD VARIATIONS...
Publication number
20190154777
Publication date
May 23, 2019
Koninklijke Philips N.V.
GERARDUS BERNARDUS JOZEF MULDER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CRYOGENIC COOLING SYSTEM WITH TEMPERATURE-DEPENDENT THERMAL SHUNT
Publication number
20180347866
Publication date
Dec 6, 2018
Koninklijke Philips N.V.
THOMAS ERIK AMTHOR
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY RAMPING DOWN A SUPERCONDUCTING...
Publication number
20180278044
Publication date
Sep 27, 2018
Philip Alexander Jonas
G01 - MEASURING TESTING
Information
Patent Application
SUPERCONDUCTING MAGNET WITH CRYOGENIC THERMAL BUFFER
Publication number
20170263361
Publication date
Sep 14, 2017
Koninklijke Philips N.V.
GERARDUS BERNARDUS JOZEF MULDER
G01 - MEASURING TESTING
Information
Patent Application
AIR VENTILATION SYSTEM WITH RADIO FREQUENCY SHIELDING FOR USE IN MA...
Publication number
20170108563
Publication date
Apr 20, 2017
GERARDUS GERNARDUS JOZEF MULDER
G01 - MEASURING TESTING
Information
Patent Application
SUPERCONDUCTING COIL SUPPORT DEVICE AND METHOD AND APPARATUS INCLUD...
Publication number
20170097397
Publication date
Apr 6, 2017
PHILIP ALEXANDER JONAS
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR AUTOMATICALLY RAMPING DOWN A SUPERCONDUCTING...
Publication number
20150255977
Publication date
Sep 10, 2015
Koninklijke Philips N.V.
Philip Alexander Jonas
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
RF SHIELD FOR MRI COMPRISING CONDUCTIVE COATING AS SHIELDING MATERIAL
Publication number
20130207659
Publication date
Aug 15, 2013
Koninklijke Philips Electronics N.V.
Cornelis Leonardus Gerardus Ham
C25 - ELECTROLYTIC OR ELECTROPHORETIC PROCESSES APPARATUS THEREFOR
Information
Patent Application
Shielded treatment room and device suitable for recording images on...
Publication number
20070170918
Publication date
Jul 26, 2007
Koninklijke Philips Electronics N.V.
Marinus Ludovicus Adrianus Vrinten
G01 - MEASURING TESTING
Information
Patent Application
Magnetic resonance imaging scanner with molded fixed shims
Publication number
20070030004
Publication date
Feb 8, 2007
William H. Amor
G01 - MEASURING TESTING
Information
Patent Application
Cooling of a mri system
Publication number
20050104700
Publication date
May 19, 2005
Gerardus Bernardus Jozef Mulder
G01 - MEASURING TESTING
Information
Patent Application
Method of and device for the compensation of variations of the main...
Publication number
20040169513
Publication date
Sep 2, 2004
Cornelis L. G. Ham
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR ALIGNING A MAGNETIC FIELD MODIFYING STRUCT...
Publication number
20040070396
Publication date
Apr 15, 2004
Koninklijke Philips Electronics N.V.
Gordon D. DeMeester
G01 - MEASURING TESTING
Information
Patent Application
MRI apparatus with flexible gradient control
Publication number
20010024122
Publication date
Sep 27, 2001
Gerardus Bernardus Jozef Mulder
G01 - MEASURING TESTING