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Gerd Benner
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Aalen, DE
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Patents Grants
last 30 patents
Information
Patent Grant
Method for automatically aligning a scanning transmission electron...
Patent number
10,811,216
Issue date
Oct 20, 2020
TESCAN BRNO s.r.o
Stanislav Petras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam system and method for operating a particle optical unit
Patent number
9,991,089
Issue date
Jun 5, 2018
Carl Zeiss Microscopy GmbH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam system and method for operating a particle optical unit
Patent number
9,799,485
Issue date
Oct 24, 2017
Carl Zeiss Microscopy GmbH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope
Patent number
9,543,115
Issue date
Jan 10, 2017
Carl Zeiss Microscopy GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle optical system
Patent number
9,349,571
Issue date
May 24, 2016
Carl Zeiss Microscopy GmbH
Thomas Kemen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscopy system and method of operating a t...
Patent number
8,748,819
Issue date
Jun 10, 2014
Carl Zeiss Microscopy GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Transmission electron microscope
Patent number
8,598,526
Issue date
Dec 3, 2013
Carl Zeiss Microscopy GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Precession diffraction charged particle beam system
Patent number
8,541,739
Issue date
Sep 24, 2013
Carl Zeiss Microscopy GmbH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam microscope
Patent number
8,476,589
Issue date
Jul 2, 2013
Carl Zeiss Microscopy GmbH
Gerd Benner
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Particle-beam microscope
Patent number
8,471,203
Issue date
Jun 25, 2013
Carl Zeiss Microscopy GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
Patent number
8,436,302
Issue date
May 7, 2013
Carl Zeiss Microscopy GmbH
Rasmus Schröder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron beam device
Patent number
8,431,894
Issue date
Apr 30, 2013
Carl Zeiss Microscopy GmbH
Erik Essers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Phase contrast electron microscope
Patent number
8,330,105
Issue date
Dec 11, 2012
Carl Zeiss NTS GmbH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Grant
Particle beam apparatus having an annularly-shaped illumination ape...
Patent number
8,299,442
Issue date
Oct 30, 2012
Carl Zeiss NTS GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
Patent number
8,173,963
Issue date
May 8, 2012
Carl Zeizz NTS GmbH
Rasmus Schröder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Phase contrast electron microscope
Patent number
8,039,796
Issue date
Oct 18, 2011
Carl Zeizz NTS GmbH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
Patent number
7,902,506
Issue date
Mar 8, 2011
Carl Zeiss NTS GmbH
Rasmus Schröder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Phase contrast electron microscope
Patent number
7,741,602
Issue date
Jun 22, 2010
Carl Zeiss NTS GmbH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Grant
Detector system for a particle beam apparatus, and particle beam ap...
Patent number
7,060,978
Issue date
Jun 13, 2006
Carl Zeiss NTS GmbH
Volker Drexel
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron microscope with annular illuminating aperture
Patent number
6,797,956
Issue date
Sep 28, 2004
LEO Elektronenmikroskopie GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Process for electron beam lithography, and electron-optical lithogr...
Patent number
6,657,211
Issue date
Dec 2, 2003
Leo Elektronenmikroskopie
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle-optic illuminating and imaging system with a condenser-obj...
Patent number
6,531,698
Issue date
Mar 11, 2003
LEO Elektronenmikroskopie GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle-optical apparatus and process for the particle-optical pro...
Patent number
6,437,353
Issue date
Aug 20, 2002
Carl-Zeiss-Stiftung
Gerd Benner
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Energy filter, particularly for an electron microscope
Patent number
6,040,576
Issue date
Mar 21, 2000
Leo Elektronenmikroskopie GmbH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Electron-optical imaging system having controllable elements
Patent number
5,519,216
Issue date
May 21, 1996
Carl-Zeiss-Stiftung
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of illuminating an object with a focused electron beam and a...
Patent number
5,483,073
Issue date
Jan 9, 1996
Carl-Zeiss-Stiftung
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of illuminating an object in a transmission electron microscope
Patent number
5,013,913
Issue date
May 7, 1991
Carl-Zeiss-Stiftung
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR AUTOMATICALLY ALIGNING A SCANNING TRANSMISSION ELECTRON...
Publication number
20190295810
Publication date
Sep 26, 2019
TESCAN BRNO s.r.o.
Stanislav Petras
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
Publication number
20180040454
Publication date
Feb 8, 2018
CARL ZEISS MICROSCOPY GMBH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
Publication number
20150357157
Publication date
Dec 10, 2015
CARL ZEISS MICROSCOPY GMBH
Ingo Mueller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ELECTRON MICROSCOPE
Publication number
20150144787
Publication date
May 28, 2015
CARL ZEISS MICROSCOPY GMBH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Optical System
Publication number
20150069235
Publication date
Mar 12, 2015
CARL ZEISS MICROSCOPY GMBH
Thomas Kemen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission Electron Microscopy System and Method of Operating a T...
Publication number
20130292566
Publication date
Nov 7, 2013
CARL ZEISS MICROSCOPY GMBH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
APPARATUS FOR CONTAMINANTS BEING DEPOSITED THEREON
Publication number
20130256558
Publication date
Oct 3, 2013
Christian DIETL
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...
Publication number
20130001445
Publication date
Jan 3, 2013
Rasmus Schroder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Particle Beam Microscope
Publication number
20120326032
Publication date
Dec 27, 2012
CARL ZEISS MICROSCOPY GMBH
Gerd Benner
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
Particle Beam Microscope
Publication number
20120326030
Publication date
Dec 27, 2012
CARL ZEISS NTS GMBH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Application
PHASE CONTRAST ELECTRON MICROSCOPE
Publication number
20120049062
Publication date
Mar 1, 2012
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Application
CHARGED PARTICLE BEAM SYSTEM
Publication number
20120025094
Publication date
Feb 2, 2012
CARL ZEISS NTS GMBH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Application
Phase-shifting element and particle beam device having a phase-shif...
Publication number
20110233402
Publication date
Sep 29, 2011
Rasmus Schroder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Transmission Electron Microscope
Publication number
20110210249
Publication date
Sep 1, 2011
CARL ZEISS NTS GMBH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PARTICLE-BEAM MICROSCOPE
Publication number
20100258719
Publication date
Oct 14, 2010
CARL ZEISS NTS GMBH
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Phase contrast electron microscope
Publication number
20100181481
Publication date
Jul 22, 2010
Carl Zeiss NTS GmbH
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Application
Particle beam apparatus having an annularly-shaped illumination ape...
Publication number
20100038537
Publication date
Feb 18, 2010
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Electron beam device
Publication number
20090039257
Publication date
Feb 12, 2009
Erik Essers
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Phase-shifting element and particle beam device having a phase-shif...
Publication number
20080296509
Publication date
Dec 4, 2008
Rasmus Schroder
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Phase contrast electron microscope
Publication number
20070284528
Publication date
Dec 13, 2007
Gerd Benner
G01 - MEASURING TESTING
Information
Patent Application
Electron microscope with annular illuminating aperture
Publication number
20030132383
Publication date
Jul 17, 2003
Gerd Benner
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Process for electron beam lithography, and electron-optical lithogr...
Publication number
20020043629
Publication date
Apr 18, 2002
Gerd Benner
B82 - NANO-TECHNOLOGY
Information
Patent Application
Detector system for a particle beam apparatus, and particle beam ap...
Publication number
20020011565
Publication date
Jan 31, 2002
Volker Drexel
H01 - BASIC ELECTRIC ELEMENTS