Gerd Benner

Person

Aalen, DE

People

Patents Grantslast 30 patents

Information Patent Grant
Method for automatically aligning a scanning transmission electron...
- Patent number 10,811,216
- Issue date Oct 20, 2020
- TESCAN BRNO s.r.o
- Stanislav Petras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating a particle optical unit
- Patent number 9,991,089
- Issue date Jun 5, 2018
- Carl Zeiss Microscopy GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam system and method for operating a particle optical unit
- Patent number 9,799,485
- Issue date Oct 24, 2017
- Carl Zeiss Microscopy GmbH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope
- Patent number 9,543,115
- Issue date Jan 10, 2017
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle optical system
- Patent number 9,349,571
- Issue date May 24, 2016
- Carl Zeiss Microscopy GmbH
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscopy system and method of operating a t...
- Patent number 8,748,819
- Issue date Jun 10, 2014
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Transmission electron microscope
- Patent number 8,598,526
- Issue date Dec 3, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Precession diffraction charged particle beam system
- Patent number 8,541,739
- Issue date Sep 24, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam microscope
- Patent number 8,476,589
- Issue date Jul 2, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Particle-beam microscope
- Patent number 8,471,203
- Issue date Jun 25, 2013
- Carl Zeiss Microscopy GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,436,302
- Issue date May 7, 2013
- Carl Zeiss Microscopy GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron beam device
- Patent number 8,431,894
- Issue date Apr 30, 2013
- Carl Zeiss Microscopy GmbH
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase contrast electron microscope
- Patent number 8,330,105
- Issue date Dec 11, 2012
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Particle beam apparatus having an annularly-shaped illumination ape...
- Patent number 8,299,442
- Issue date Oct 30, 2012
- Carl Zeiss NTS GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 8,173,963
- Issue date May 8, 2012
- Carl Zeizz NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase contrast electron microscope
- Patent number 8,039,796
- Issue date Oct 18, 2011
- Carl Zeizz NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Phase-shifting element and particle beam device having a phase-shif...
- Patent number 7,902,506
- Issue date Mar 8, 2011
- Carl Zeiss NTS GmbH
- Rasmus Schröder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Phase contrast electron microscope
- Patent number 7,741,602
- Issue date Jun 22, 2010
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Grant
Detector system for a particle beam apparatus, and particle beam ap...
- Patent number 7,060,978
- Issue date Jun 13, 2006
- Carl Zeiss NTS GmbH
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron microscope with annular illuminating aperture
- Patent number 6,797,956
- Issue date Sep 28, 2004
- LEO Elektronenmikroskopie GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Process for electron beam lithography, and electron-optical lithogr...
- Patent number 6,657,211
- Issue date Dec 2, 2003
- Leo Elektronenmikroskopie
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optic illuminating and imaging system with a condenser-obj...
- Patent number 6,531,698
- Issue date Mar 11, 2003
- LEO Elektronenmikroskopie GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle-optical apparatus and process for the particle-optical pro...
- Patent number 6,437,353
- Issue date Aug 20, 2002
- Carl-Zeiss-Stiftung
- Gerd Benner
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Energy filter, particularly for an electron microscope
- Patent number 6,040,576
- Issue date Mar 21, 2000
- Leo Elektronenmikroskopie GmbH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron-optical imaging system having controllable elements
- Patent number 5,519,216
- Issue date May 21, 1996
- Carl-Zeiss-Stiftung
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of illuminating an object with a focused electron beam and a...
- Patent number 5,483,073
- Issue date Jan 9, 1996
- Carl-Zeiss-Stiftung
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of illuminating an object in a transmission electron microscope
- Patent number 5,013,913
- Issue date May 7, 1991
- Carl-Zeiss-Stiftung
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR AUTOMATICALLY ALIGNING A SCANNING TRANSMISSION ELECTRON...
- Publication number 20190295810
- Publication date Sep 26, 2019
- TESCAN BRNO s.r.o.
- Stanislav Petras
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
- Publication number 20180040454
- Publication date Feb 8, 2018
- CARL ZEISS MICROSCOPY GMBH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT
- Publication number 20150357157
- Publication date Dec 10, 2015
- CARL ZEISS MICROSCOPY GMBH
- Ingo Mueller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON MICROSCOPE
- Publication number 20150144787
- Publication date May 28, 2015
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Optical System
- Publication number 20150069235
- Publication date Mar 12, 2015
- CARL ZEISS MICROSCOPY GMBH
- Thomas Kemen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscopy System and Method of Operating a T...
- Publication number 20130292566
- Publication date Nov 7, 2013
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR CONTAMINANTS BEING DEPOSITED THEREON
- Publication number 20130256558
- Publication date Oct 3, 2013
- Christian DIETL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...
- Publication number 20130001445
- Publication date Jan 3, 2013
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Particle Beam Microscope
- Publication number 20120326032
- Publication date Dec 27, 2012
- CARL ZEISS MICROSCOPY GMBH
- Gerd Benner
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
Particle Beam Microscope
- Publication number 20120326030
- Publication date Dec 27, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
PHASE CONTRAST ELECTRON MICROSCOPE
- Publication number 20120049062
- Publication date Mar 1, 2012
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM SYSTEM
- Publication number 20120025094
- Publication date Feb 2, 2012
- CARL ZEISS NTS GMBH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
Phase-shifting element and particle beam device having a phase-shif...
- Publication number 20110233402
- Publication date Sep 29, 2011
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Transmission Electron Microscope
- Publication number 20110210249
- Publication date Sep 1, 2011
- CARL ZEISS NTS GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE-BEAM MICROSCOPE
- Publication number 20100258719
- Publication date Oct 14, 2010
- CARL ZEISS NTS GMBH
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase contrast electron microscope
- Publication number 20100181481
- Publication date Jul 22, 2010
- Carl Zeiss NTS GmbH
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
Particle beam apparatus having an annularly-shaped illumination ape...
- Publication number 20100038537
- Publication date Feb 18, 2010
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron beam device
- Publication number 20090039257
- Publication date Feb 12, 2009
- Erik Essers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase-shifting element and particle beam device having a phase-shif...
- Publication number 20080296509
- Publication date Dec 4, 2008
- Rasmus Schroder
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Phase contrast electron microscope
- Publication number 20070284528
- Publication date Dec 13, 2007
- Gerd Benner
- G01 - MEASURING TESTING
Information Patent Application
Electron microscope with annular illuminating aperture
- Publication number 20030132383
- Publication date Jul 17, 2003
- Gerd Benner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Process for electron beam lithography, and electron-optical lithogr...
- Publication number 20020043629
- Publication date Apr 18, 2002
- Gerd Benner
- B82 - NANO-TECHNOLOGY
Information Patent Application
Detector system for a particle beam apparatus, and particle beam ap...
- Publication number 20020011565
- Publication date Jan 31, 2002
- Volker Drexel
- H01 - BASIC ELECTRIC ELEMENTS

Gerd Benner

Person

Patents Grantslast 30 patents

Method for automatically aligning a scanning transmission electron...

Particle beam system and method for operating a particle optical unit

Particle beam system and method for operating a particle optical unit

Electron microscope

Particle optical system

Transmission electron microscopy system and method of operating a t...

Transmission electron microscope

Precession diffraction charged particle beam system

Particle beam microscope

Particle-beam microscope

Phase-shifting element and particle beam device having a phase-shif...

Electron beam device

Phase contrast electron microscope

Particle beam apparatus having an annularly-shaped illumination ape...

Phase-shifting element and particle beam device having a phase-shif...

Phase contrast electron microscope

Phase-shifting element and particle beam device having a phase-shif...

Phase contrast electron microscope

Detector system for a particle beam apparatus, and particle beam ap...

Electron microscope with annular illuminating aperture

Process for electron beam lithography, and electron-optical lithogr...

Particle-optic illuminating and imaging system with a condenser-obj...

Particle-optical apparatus and process for the particle-optical pro...

Energy filter, particularly for an electron microscope

Electron-optical imaging system having controllable elements

Method of illuminating an object with a focused electron beam and a...

Method of illuminating an object in a transmission electron microscope

Patents Applicationslast 30 patents

METHOD FOR AUTOMATICALLY ALIGNING A SCANNING TRANSMISSION ELECTRON...

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT

PARTICLE BEAM SYSTEM AND METHOD FOR OPERATING A PARTICLE OPTICAL UNIT

ELECTRON MICROSCOPE

Particle Optical System

Transmission Electron Microscopy System and Method of Operating a T...

APPARATUS FOR CONTAMINANTS BEING DEPOSITED THEREON

PHASE-SHIFTING ELEMENT AND PARTICLE BEAM DEVICE HAVING A PHASE-SHIF...

Particle Beam Microscope

Particle Beam Microscope

PHASE CONTRAST ELECTRON MICROSCOPE

CHARGED PARTICLE BEAM SYSTEM

Phase-shifting element and particle beam device having a phase-shif...

Transmission Electron Microscope

PARTICLE-BEAM MICROSCOPE

Phase contrast electron microscope

Particle beam apparatus having an annularly-shaped illumination ape...

Electron beam device

Phase-shifting element and particle beam device having a phase-shif...

Phase contrast electron microscope

Electron microscope with annular illuminating aperture

Process for electron beam lithography, and electron-optical lithogr...

Detector system for a particle beam apparatus, and particle beam ap...