Gerd Wartmann

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Greenwood, IN, US

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Patents Grantslast 30 patents

Information Patent Grant
Probe mapping diagnostic methods
- Patent number 6,559,657
- Issue date May 6, 2003
- Endress + Hauser GmbH + Co.
- William Patrick McCarthy
- G01 - MEASURING TESTING
Information Patent Grant
Periodic probe mapping
- Patent number 6,078,280
- Issue date Jun 20, 2000
- Endress + Hauser GmbH + Co.
- Kenneth L. Perdue
- G01 - MEASURING TESTING
Information Patent Grant
Partial probe mapping
- Patent number 5,973,637
- Issue date Oct 26, 1999
- Endress + Hauser GmbH + Co.
- Kenneth Lee Perdue
- G01 - MEASURING TESTING
Information Patent Grant
Processor apparatus and method for a process measurement signal
- Patent number 5,841,666
- Issue date Nov 24, 1998
- Endress + Hauser GmbH + Co.
- Kenneth L. Perdue
- G01 - MEASURING TESTING
Information Patent Grant
Sensor apparatus for process measurement
- Patent number 5,661,251
- Issue date Aug 26, 1997
- Endress + Hauser GmbH + Co.
- Donald D. Cummings
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device for measuring the filling level of a filling material in a c...
- Publication number 20020017131
- Publication date Feb 14, 2002
- EndressGmbH+Co.
- Joachim Neuhaus
- G01 - MEASURING TESTING