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Gerhard Bayer
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Lindau, DE
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last 30 patents
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Patent Grant
Process and device for the automatic location of reference markers
Patent number
6,734,952
Issue date
May 11, 2004
Leica Geosystems, AG
Paul Benz
G01 - MEASURING TESTING
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Patent Grant
Process and device for rapid detection of the position of a target...
Patent number
6,031,606
Issue date
Feb 29, 2000
Leica Geosystems AG
Gerhard Bayer
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
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Patent Application
Process and device for the automatic location of reference markers
Publication number
20030169414
Publication date
Sep 11, 2003
Paul Benz
G01 - MEASURING TESTING