Gerhard Beck

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Berlin, DE

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Patents Grantslast 30 patents

Information Patent Grant
Microwave measuring and apparatus for contactless non-destructive t...
- Patent number 4,704,576
- Issue date Nov 3, 1987
- Hahn-Meitner-Institut fur Kernforschung Berlin GmbH
- Helmut Tributsch
- G01 - MEASURING TESTING
Information Patent Grant
System for optimizing process parameters in photoactive semiconduct...
- Patent number 4,700,311
- Issue date Oct 13, 1987
- Hahn-Meitner-Institut fur Kernforschung Berlin GmbH
- Helmut Tributsch
- H01 - BASIC ELECTRIC ELEMENTS