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Gerhard Daniel
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Portland, OR, US
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Patents Grants
last 30 patents
Information
Patent Grant
Method for S/TEM sample analysis
Patent number
9,581,526
Issue date
Feb 28, 2017
FEI Company
Jason Arjavac
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
9,349,570
Issue date
May 24, 2016
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Method for S/TEM sample analysis
Patent number
9,275,831
Issue date
Mar 1, 2016
FEI Company
Jason Arjavac
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
8,993,962
Issue date
Mar 31, 2015
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Grant
Method for S/TEM sample analysis
Patent number
8,890,064
Issue date
Nov 18, 2014
FEI Company
Jason Arjavac
G01 - MEASURING TESTING
Information
Patent Grant
Method for S/TEM sample analysis
Patent number
8,455,821
Issue date
Jun 4, 2013
FEI Company
Jason Arjavac
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for sample extraction and handling
Patent number
8,357,913
Issue date
Jan 22, 2013
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
Publication number
20160163506
Publication date
Jun 9, 2016
FEI Company
Jason Arjavac
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and Apparatus for Sample Extraction and Handling
Publication number
20150311034
Publication date
Oct 29, 2015
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
Method for S/TEM Sample Analysis
Publication number
20150206707
Publication date
Jul 23, 2015
FEI Company
Jason Arjavac
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
Publication number
20130341505
Publication date
Dec 26, 2013
FEI Company
Jason Arjavac
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
Publication number
20130153785
Publication date
Jun 20, 2013
FEI Company
Enrique Agorio
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR S/TEM SAMPLE ANALYSIS
Publication number
20110006207
Publication date
Jan 13, 2011
FEI COMPANY
Jason Arjavac
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
Publication number
20100305747
Publication date
Dec 2, 2010
FEI Company
Enrique Agorio
G01 - MEASURING TESTING