Gerhard Hoppen

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Wetzlar, DE

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus for the optical inspection of wafers
- Patent number 8,451,440
- Issue date May 28, 2013
- KLA-Tencor MIE GmbH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Grant
Illumination device, and coordinate measuring instrument having an...
- Patent number 7,209,243
- Issue date Apr 24, 2007
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G01 - MEASURING TESTING
Information Patent Grant
DUV-capable microscope objective with parfocal IR focus
- Patent number 7,050,223
- Issue date May 23, 2006
- Leica Microsystems Semiconductor GmbH
- Gerhard Hoppen
- G02 - OPTICS
Information Patent Grant
Inspection microscope and objective for an inspection microscope
- Patent number 7,019,910
- Issue date Mar 28, 2006
- Leica Microsystems Semiconductor GmbH
- Gerhard Hoppen
- G02 - OPTICS
Information Patent Grant
Illumination device; and coordinate measuring instrument having an...
- Patent number 6,975,409
- Issue date Dec 13, 2005
- Leica Microsystems Semiconductor GmbH
- Franz Cemic
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for the Optical Inspection of Wafers
- Publication number 20100295938
- Publication date Nov 25, 2010
- KLA-TENCOR MIE GMBH
- Kurt Hahn
- G01 - MEASURING TESTING
Information Patent Application
Illumination device, and coordinate measuring instrument having an...
- Publication number 20040160777
- Publication date Aug 19, 2004
- Leica Microsystems Wetzlar GmbH
- Franz Cemic
- G02 - OPTICS
Information Patent Application
Inspection microscope and objective for an inspection microscope
- Publication number 20020186463
- Publication date Dec 12, 2002
- LEICA MICROSYSTEMS SEMICONDUCTOR GmbH
- Gerhard Hoppen
- G02 - OPTICS
Information Patent Application
Illumination device; and coordinate measuring instrument having an...
- Publication number 20020001090
- Publication date Jan 3, 2002
- Leica Microsystems Wetzlar GmbH.
- Franz Cemic
- G01 - MEASURING TESTING